Critical current stability of 2G REBCO tape for space-flight HTS leads

Edgar R Canavan, Brian Comber
{"title":"Critical current stability of 2G REBCO tape for space-flight HTS leads","authors":"Edgar R Canavan, Brian Comber","doi":"10.1088/1757-899x/1302/1/012016","DOIUrl":null,"url":null,"abstract":"High reliability is an essential requirement for all spaceflight hardware. Like the Hitomi x-ray observatory, its follow-on mission XRISM uses 2G REBCO tapes as current leads for the superconducting magnets that are a key component of the Adiabatic Demagnetization Refrigerator (ADR) that cools the detector array. While the Hitomi Soft X-ray Spectrometer (SXS) worked flawlessly in orbit, during its development there were indications that the critical current of its specialized REBCO tapes could degrade over time when exposed to normal-humidity air. To demonstrate that the updates to the XRISM HTS lead assemblies had mitigated this risk, a series of tests were carried out to measure the stability of <italic toggle=\"yes\">I<sub>c</sub>\n</italic> of dozens of samples over a period greater than the flight assemblies were exposed to air during integration and test. The test rig allowed not only the measurement of the sample <italic toggle=\"yes\">I<sub>c</sub>\n</italic>, but also the localization of the voltage rise as the current approached <italic toggle=\"yes\">I<sub>c</sub>\n</italic>. We will discuss the trends in the critical current of the samples, as well as localization of lower <italic toggle=\"yes\">I<sub>c</sub>\n</italic> regions.","PeriodicalId":14483,"journal":{"name":"IOP Conference Series: Materials Science and Engineering","volume":"18 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IOP Conference Series: Materials Science and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/1757-899x/1302/1/012016","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

High reliability is an essential requirement for all spaceflight hardware. Like the Hitomi x-ray observatory, its follow-on mission XRISM uses 2G REBCO tapes as current leads for the superconducting magnets that are a key component of the Adiabatic Demagnetization Refrigerator (ADR) that cools the detector array. While the Hitomi Soft X-ray Spectrometer (SXS) worked flawlessly in orbit, during its development there were indications that the critical current of its specialized REBCO tapes could degrade over time when exposed to normal-humidity air. To demonstrate that the updates to the XRISM HTS lead assemblies had mitigated this risk, a series of tests were carried out to measure the stability of Ic of dozens of samples over a period greater than the flight assemblies were exposed to air during integration and test. The test rig allowed not only the measurement of the sample Ic , but also the localization of the voltage rise as the current approached Ic . We will discuss the trends in the critical current of the samples, as well as localization of lower Ic regions.
用于太空飞行 HTS 导线的 2G REBCO 磁带的临界电流稳定性
高可靠性是所有航天硬件的基本要求。与瞳 X 射线观测站一样,其后续任务 XRISM 也使用 2G REBCO 磁带作为超导磁体的电流导线,而超导磁体是绝热消磁制冷器(ADR)的关键部件,用于冷却探测器阵列。虽然 Hitomi 软 X 射线分光计(SXS)在轨道上的工作完美无瑕,但在其开发过程中,有迹象表明其专用 REBCO 磁带的临界电流在暴露于正常湿度的空气中时可能会随着时间的推移而降低。为了证明对 XRISM HTS 引线组件的更新已经降低了这一风险,我们进行了一系列测试,测量数十个样品在比飞行组件在集成和测试期间暴露在空气中的时间更长的时间内 Ic 的稳定性。测试设备不仅可以测量样品的 Ic,还可以在电流接近 Ic 时对电压上升进行定位。我们将讨论样品临界电流的趋势以及低 Ic 区域的定位。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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