{"title":"Identifying Active Anomalies in a Multilayered Medium by Passive Measurement in EIT","authors":"Youjun Deng, Hongyu Liu, Yajuan Wang","doi":"10.1137/23m1599458","DOIUrl":null,"url":null,"abstract":"SIAM Journal on Applied Mathematics, Volume 84, Issue 4, Page 1362-1384, August 2024. <br/> Abstract. We propose to study an inverse problem of determining multiple anomalies embedded in a multilayered background medium by the associated electric measurement which arises in Electrical Impedance Tomography (EIT). There are several salient features of our study. First, the anomaly considered in our study is extremely general which is characterized by its location, support, varying size, conductivity parameter, as well as a carry-on source intensity. Second, we make use of the measurement of the electric field generated by the active anomalies. This corresponds to a single passive measurement. Third, the background medium is of a multilayered and piecewise-constant structure and can be used to model a more general scenario from practical applications; say, e.g., the human body. Under the condition that the anomalies are small, but still in multiple scales considering their varying sizes, we derive a sharp formula of the electric field in terms of the polarization tensors, which enables us to establish comprehensive unique identifiability results in determining the characteristic parameters of the active anomalies in different situations.","PeriodicalId":51149,"journal":{"name":"SIAM Journal on Applied Mathematics","volume":null,"pages":null},"PeriodicalIF":1.9000,"publicationDate":"2024-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SIAM Journal on Applied Mathematics","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1137/23m1599458","RegionNum":4,"RegionCategory":"数学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATHEMATICS, APPLIED","Score":null,"Total":0}
引用次数: 0
Abstract
SIAM Journal on Applied Mathematics, Volume 84, Issue 4, Page 1362-1384, August 2024. Abstract. We propose to study an inverse problem of determining multiple anomalies embedded in a multilayered background medium by the associated electric measurement which arises in Electrical Impedance Tomography (EIT). There are several salient features of our study. First, the anomaly considered in our study is extremely general which is characterized by its location, support, varying size, conductivity parameter, as well as a carry-on source intensity. Second, we make use of the measurement of the electric field generated by the active anomalies. This corresponds to a single passive measurement. Third, the background medium is of a multilayered and piecewise-constant structure and can be used to model a more general scenario from practical applications; say, e.g., the human body. Under the condition that the anomalies are small, but still in multiple scales considering their varying sizes, we derive a sharp formula of the electric field in terms of the polarization tensors, which enables us to establish comprehensive unique identifiability results in determining the characteristic parameters of the active anomalies in different situations.
期刊介绍:
SIAM Journal on Applied Mathematics (SIAP) is an interdisciplinary journal containing research articles that treat scientific problems using methods that are of mathematical interest. Appropriate subject areas include the physical, engineering, financial, and life sciences. Examples are problems in fluid mechanics, including reaction-diffusion problems, sedimentation, combustion, and transport theory; solid mechanics; elasticity; electromagnetic theory and optics; materials science; mathematical biology, including population dynamics, biomechanics, and physiology; linear and nonlinear wave propagation, including scattering theory and wave propagation in random media; inverse problems; nonlinear dynamics; and stochastic processes, including queueing theory. Mathematical techniques of interest include asymptotic methods, bifurcation theory, dynamical systems theory, complex network theory, computational methods, and probabilistic and statistical methods.