{"title":"Integrated Scanning Electrochemical Cell Microscopy Platform with Local Electrochemical Impedance Spectroscopy using Preamplifier","authors":"Ancheng Wang, Rong Jin, Dechen Jiang","doi":"10.1039/d4fd00122b","DOIUrl":null,"url":null,"abstract":"Local electrochemical impedance spectroscopy (LEIS) has emerged to characterize local electrochemical processes on heterogeneous surfaces. However, the current LEIS heavily relies on lock-in amplifier that has a poor gain effect for weak current, limiting the achievement of high-spatial imaging. Herein, an integrated scanning electrochemical cell microscopy is developed by directly collecting the alternating current (AC) current signal through a preamplifier. The recorded local current (sub nA-level) is compared with the initial excitation signal to get the parameters for Nyquist plotting. By integrating this method into a scanning electrochemical cell microscopy (SECCM), an image of LEIS at the Indium Tin Oxide/gold (ITO/Au) electrode is obtained with a spatial resolution of 180 nm. The established SECCM platform is integrated that could be positioned into the limited space (e.g. glove box) for real characterization of electrodes.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1039/d4fd00122b","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Local electrochemical impedance spectroscopy (LEIS) has emerged to characterize local electrochemical processes on heterogeneous surfaces. However, the current LEIS heavily relies on lock-in amplifier that has a poor gain effect for weak current, limiting the achievement of high-spatial imaging. Herein, an integrated scanning electrochemical cell microscopy is developed by directly collecting the alternating current (AC) current signal through a preamplifier. The recorded local current (sub nA-level) is compared with the initial excitation signal to get the parameters for Nyquist plotting. By integrating this method into a scanning electrochemical cell microscopy (SECCM), an image of LEIS at the Indium Tin Oxide/gold (ITO/Au) electrode is obtained with a spatial resolution of 180 nm. The established SECCM platform is integrated that could be positioned into the limited space (e.g. glove box) for real characterization of electrodes.
局部电化学阻抗光谱法(LEIS)是为描述异质表面的局部电化学过程而出现的。然而,目前的局部电化学阻抗光谱主要依赖于锁相放大器,该放大器对微弱电流的增益效果不佳,限制了高空间成像的实现。在此,我们开发了一种集成扫描电化学细胞显微镜,通过前置放大器直接采集交流电流信号。记录的局部电流(亚 nA 级)与初始激励信号进行比较,以获得奈奎斯特绘图参数。通过将此方法集成到扫描电化学电池显微镜(SECCM)中,可获得铟锡氧化物/金(ITO/Au)电极的 LEIS 图像,空间分辨率为 180 nm。已建立的 SECCM 平台可集成到有限的空间(如手套箱)中,用于电极的实际表征。