Oliver H. Seeck
{"title":"Overview over Surface Sensitive X-Ray Techniques","authors":"Oliver H. Seeck","doi":"10.1080/08940886.2024.2351337","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":39020,"journal":{"name":"Synchrotron Radiation News","volume":"19 9","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Synchrotron Radiation News","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/08940886.2024.2351337","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Physics and Astronomy","Score":null,"Total":0}
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