Victor Poline, Ravi Raj Purohit Purushottam Raj Purohit, Pierre Bordet, Nils Blanc, Pauline Martinetto
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引用次数: 0
Abstract
Recent developments in synchrotron radiation facilities have increased the amount of data generated during acquisitions considerably, requiring fast and efficient data processing techniques. Here, the application of dense neural networks (DNNs) to data treatment of X-ray diffraction computed tomography (XRD-CT) experiments is presented. Processing involves mapping the phases in a tomographic slice by predicting the phase fraction in each individual pixel. DNNs were trained on sets of calculated XRD patterns generated using a Python algorithm developed in-house. An initial Rietveld refinement of the tomographic slice sum pattern provides additional information (peak widths and integrated intensities for each phase) to improve the generation of simulated patterns and make them closer to real data. A grid search was used to optimize the network architecture and demonstrated that a single fully connected dense layer was sufficient to accurately determine phase proportions. This DNN was used on the XRD-CT acquisition of a mock-up and a historical sample of highly heterogeneous multi-layered decoration of a late medieval statue, called 'applied brocade'. The phase maps predicted by the DNN were in good agreement with other methods, such as non-negative matrix factorization and serial Rietveld refinements performed with TOPAS, and outperformed them in terms of speed and efficiency. The method was evaluated by regenerating experimental patterns from predictions and using the R-weighted profile as the agreement factor. This assessment allowed us to confirm the accuracy of the results.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.