Use of parametric X-ray radiation of electrons in crystals to determine the parameters of imaging-plates

Abstract

Good agreement between experimental data and the results of calculations of the yield and angular distributions of parametric X-ray radiation of electrons in crystals within the framework of kinematic theory enables us to use the measurement results to determine the photon energy dependence of the sensitivity of X-ray plates. The results of measurements of the angular distributions of parametric X-ray radiation of electrons with an energy of 255 MeV in a Si crystal using imaging plates of several types were compared with the results of calculations that take into account all currently known experimental factors that influence the measurement results. The spectral dependence of the sensitivity of the studied X-ray plates was determined for photon energies of two orders of reflection and for the (111), (1̅1̅1), and (110) reflection planes.