{"title":"Empirical models for calculating soil wetting patterns under surface drip irrigation systems: A comprehensive analysis","authors":"Ge Li, Weibo Nie, Yuchen Li","doi":"10.1002/ird.2982","DOIUrl":null,"url":null,"abstract":"Accurate estimation of the surface wetted radius (R) and vertical wetted depth (Z) of wetting patterns in drip irrigation systems is crucial for ensuring that the designs of such systems are effective. This study compared 14 empirical models for estimating drip irrigation wetting patterns by assessing their accuracy using published measurement data and HYDRUS‐2D/3D simulations. The technique for order of preference by similarity to the ideal solution (TOPSIS) was employed to comprehensively rank the models. The results indicate that the empirical model proposed by Fan et al. (2023) (FY) exhibited the highest accuracy when the estimations of R and measured and simulated values were compared, with mean absolute error (MAE), root mean square error (RMSE), Nash–Sutcliffe modelling efficiency (NSE), and percent bias (PB) values of 2.2 cm, 3.4 cm, 0.79, and −7.1% and 5.2 cm, 7.0 cm, 0.50, and −14.1%, respectively. The empirical model proposed by Amin and Ekhmaj (2006) (AE) demonstrated the highest accuracy when the estimations of Z were compared with measured and simulated values, with MAE, RMSE, NSE and PB values of 1.7 cm, 2.0 cm, 0.95 and 4.15% and 4.4 cm, 5.9 cm, 0.82 and 4.7%, respectively. The comprehensive rankings of available models in the present study indicate that the FY model is the most universally applicable, followed by the Li et al. (2022) (LY) model, with comprehensive indices of 0.960 and 0.936, respectively. This research can aid in the selection of universally applicable, reliable and straightforward empirical models for estimating wetting patterns in drip irrigation systems.","PeriodicalId":505999,"journal":{"name":"Irrigation and Drainage","volume":"7 9","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Irrigation and Drainage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/ird.2982","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Accurate estimation of the surface wetted radius (R) and vertical wetted depth (Z) of wetting patterns in drip irrigation systems is crucial for ensuring that the designs of such systems are effective. This study compared 14 empirical models for estimating drip irrigation wetting patterns by assessing their accuracy using published measurement data and HYDRUS‐2D/3D simulations. The technique for order of preference by similarity to the ideal solution (TOPSIS) was employed to comprehensively rank the models. The results indicate that the empirical model proposed by Fan et al. (2023) (FY) exhibited the highest accuracy when the estimations of R and measured and simulated values were compared, with mean absolute error (MAE), root mean square error (RMSE), Nash–Sutcliffe modelling efficiency (NSE), and percent bias (PB) values of 2.2 cm, 3.4 cm, 0.79, and −7.1% and 5.2 cm, 7.0 cm, 0.50, and −14.1%, respectively. The empirical model proposed by Amin and Ekhmaj (2006) (AE) demonstrated the highest accuracy when the estimations of Z were compared with measured and simulated values, with MAE, RMSE, NSE and PB values of 1.7 cm, 2.0 cm, 0.95 and 4.15% and 4.4 cm, 5.9 cm, 0.82 and 4.7%, respectively. The comprehensive rankings of available models in the present study indicate that the FY model is the most universally applicable, followed by the Li et al. (2022) (LY) model, with comprehensive indices of 0.960 and 0.936, respectively. This research can aid in the selection of universally applicable, reliable and straightforward empirical models for estimating wetting patterns in drip irrigation systems.