Manh-Hung Ha, Duc-Chinh Nguyen, Manh-Tuan Do, Dinh-Thai Kim, X. Le, Ngoc-Thanh Pham
{"title":"Plant pathology identification using local-global feature level based on transformer","authors":"Manh-Hung Ha, Duc-Chinh Nguyen, Manh-Tuan Do, Dinh-Thai Kim, X. Le, Ngoc-Thanh Pham","doi":"10.11591/ijeecs.v34.i3.pp1582-1592","DOIUrl":null,"url":null,"abstract":"Deep learning plays a crucial role in addressing the challenge of plant disease identification in the field of agriculture. Detecting diseases in plants requires extensive effort, along with a comprehensive understanding of various plant diseases and increased processing time. Balancing both speed and accuracy in predicting leaf diseases in plants can significantly improve crop production and reduce environmental damage. In this paper, we examined deseases on popular plants in agriculture. We proposed a novel model to predict crop pathology on a feature space of global-local based on transformer aggregation. Paticular, we use refined feature of different layer to correlate semantics from high-level feature and low-level feature. Besides, to capture the extended temporal scale across the entire image, we employ a transformer to discern long-range dependencies among frames. Subsequently, the enhanced features incorporating these dependencies are inputted into a classifier for preliminary crop pathology prediction. The plant village dataset and VietNam strawberry disease (VNStr) dataset were utilized for training and disease classification in the experiments. Extensive experiments show that the proposed method outperforms by 99.18% and 94.05% accuracy in plant village and VNStr, respectivly. The model after being judged was applied on Android devices and therefore is easy to use.","PeriodicalId":13480,"journal":{"name":"Indonesian Journal of Electrical Engineering and Computer Science","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Indonesian Journal of Electrical Engineering and Computer Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11591/ijeecs.v34.i3.pp1582-1592","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Mathematics","Score":null,"Total":0}
引用次数: 0
Abstract
Deep learning plays a crucial role in addressing the challenge of plant disease identification in the field of agriculture. Detecting diseases in plants requires extensive effort, along with a comprehensive understanding of various plant diseases and increased processing time. Balancing both speed and accuracy in predicting leaf diseases in plants can significantly improve crop production and reduce environmental damage. In this paper, we examined deseases on popular plants in agriculture. We proposed a novel model to predict crop pathology on a feature space of global-local based on transformer aggregation. Paticular, we use refined feature of different layer to correlate semantics from high-level feature and low-level feature. Besides, to capture the extended temporal scale across the entire image, we employ a transformer to discern long-range dependencies among frames. Subsequently, the enhanced features incorporating these dependencies are inputted into a classifier for preliminary crop pathology prediction. The plant village dataset and VietNam strawberry disease (VNStr) dataset were utilized for training and disease classification in the experiments. Extensive experiments show that the proposed method outperforms by 99.18% and 94.05% accuracy in plant village and VNStr, respectivly. The model after being judged was applied on Android devices and therefore is easy to use.
期刊介绍:
The aim of Indonesian Journal of Electrical Engineering and Computer Science (formerly TELKOMNIKA Indonesian Journal of Electrical Engineering) is to publish high-quality articles dedicated to all aspects of the latest outstanding developments in the field of electrical engineering. Its scope encompasses the applications of Telecommunication and Information Technology, Applied Computing and Computer, Instrumentation and Control, Electrical (Power), Electronics Engineering and Informatics which covers, but not limited to, the following scope: Signal Processing[...] Electronics[...] Electrical[...] Telecommunication[...] Instrumentation & Control[...] Computing and Informatics[...]