{"title":"Linewidth measurement of external cavity lasers","authors":"Tom A. Kuusela","doi":"10.1119/5.0207084","DOIUrl":null,"url":null,"abstract":"Narrowband laser sources are used in applications that require high-precision or stable optical frequency. Such applications include high-resolution spectroscopy, long-distance measurement, and coherent optical communication. The linewidth of a laser is a direct measure of the laser's stability; therefore, characterization of laser linewidth is essential. In practice, however, determining a laser's linewidth is not a trivial task and typically requires expensive equipment or a complex experimental arrangement. This paper presents a straightforward, low-cost method based on unbalanced interferometry, which allows us to determine the visibility of fringe patterns as a function of the optical path difference and, consequently, the linewidth of the laser. As a test laser, we use a tunable external cavity laser source at around 780 nm, where an interference filter is employed for wavelength selection. Data obtained by applying the interferometric technique to this laser and the analysis of these data, along with the resulting linewidth value, are presented. Given that the described measurement setup is inexpensive, straightforward, and pedagogically accessible, it is well-suited for an instructional physics laboratory experiment and will also be of interest to laboratory researchers.","PeriodicalId":7589,"journal":{"name":"American Journal of Physics","volume":null,"pages":null},"PeriodicalIF":0.8000,"publicationDate":"2024-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"American Journal of Physics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1119/5.0207084","RegionNum":4,"RegionCategory":"教育学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"EDUCATION, SCIENTIFIC DISCIPLINES","Score":null,"Total":0}
引用次数: 0
Abstract
Narrowband laser sources are used in applications that require high-precision or stable optical frequency. Such applications include high-resolution spectroscopy, long-distance measurement, and coherent optical communication. The linewidth of a laser is a direct measure of the laser's stability; therefore, characterization of laser linewidth is essential. In practice, however, determining a laser's linewidth is not a trivial task and typically requires expensive equipment or a complex experimental arrangement. This paper presents a straightforward, low-cost method based on unbalanced interferometry, which allows us to determine the visibility of fringe patterns as a function of the optical path difference and, consequently, the linewidth of the laser. As a test laser, we use a tunable external cavity laser source at around 780 nm, where an interference filter is employed for wavelength selection. Data obtained by applying the interferometric technique to this laser and the analysis of these data, along with the resulting linewidth value, are presented. Given that the described measurement setup is inexpensive, straightforward, and pedagogically accessible, it is well-suited for an instructional physics laboratory experiment and will also be of interest to laboratory researchers.
期刊介绍:
The mission of the American Journal of Physics (AJP) is to publish articles on the educational and cultural aspects of physics that are useful, interesting, and accessible to a diverse audience of physics students, educators, and researchers. Our audience generally reads outside their specialties to broaden their understanding of physics and to expand and enhance their pedagogical toolkits at the undergraduate and graduate levels.