Surface matters: A case study of the scale and impact of oxide surfaces via orbital polarization

APL Materials Pub Date : 2024-05-01 DOI:10.1063/5.0198123
Lishai Shoham, M. Baskin, Y. Kauffmann, Anna Zakharova, Teppei Yoshida, Shigeki Miyasaka, Cinthia Piamonteze, L. Kornblum
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Abstract

Transition metal oxides (TMOs) exhibit a broad spectrum of functional electronic, magnetic, and optical properties, making them attractive for various technological applications. The scale and impact of surface defects and inhomogeneity can extend many unit cells below the surface. Overlooking this aspect of TMO surfaces can result in an incorrect interpretation of their physics and inhibit their maturation into device technology. Soft x-ray absorption spectroscopy (XAS) is a common technique for TMO studies, and different XAS acquisition modes can be used to measure different depth regimes in the sample. Here, we demonstrate a substantial disparity between the near-surface region and the “bulk” of the prototypical TMO SrVO3. By driving the system across two scenarios of orbital polarization, we illustrate how a common XAS surface-sensitive acquisition technique fails to detect the intrinsic orbital polarization. By stark contrast, a “bulk”-sensitive technique successfully captures this effect, elucidating the expected orbital occupation inversion. These results not only underscore the impact of the near-surface region on the correct interpretation of TMO fundamental physics, but further highlight the scale of surface inhomogeneity, a critical aspect of nanoscale functional devices.
表面问题:通过轨道极化对氧化物表面的规模和影响进行案例研究
过渡金属氧化物(TMOs)具有广泛的功能性电子、磁性和光学特性,因此对各种技术应用具有吸引力。表面缺陷和不均匀性的规模和影响可延伸至表面下许多单元格。忽视 TMO 表面的这一方面可能会导致对其物理特性的错误理解,并阻碍其在器件技术中的成熟。软 X 射线吸收光谱 (XAS) 是研究 TMO 的常用技术,不同的 XAS 采集模式可用于测量样品的不同深度。在这里,我们展示了原型 TMO SrVO3 的近表面区域和 "主体 "之间的巨大差异。通过在轨道极化的两种情况下驱动系统,我们说明了常见的 XAS 表面敏感采集技术如何无法检测到固有轨道极化。与此形成鲜明对比的是,"体 "敏感技术成功地捕捉到了这种效应,阐明了预期的轨道占据反转。这些结果不仅强调了近表面区域对正确解释 TMO 基本物理学的影响,而且进一步突出了表面不均匀性的规模,这是纳米级功能器件的一个关键方面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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