{"title":"Investigating fault injection techniques in hardware‐based deep neural networks and mutation‐based fault localization","authors":"Yves Le Traon, Tao Xie","doi":"10.1002/stvr.1880","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":501413,"journal":{"name":"Software Testing, Verification and Reliability","volume":"24 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Software Testing, Verification and Reliability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/stvr.1880","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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