Exploring wetting & scaling behavior of rough silicon surfaces

IF 1.1 4区物理与天体物理 Q3 NUCLEAR SCIENCE & TECHNOLOGY

Radiation Effects and Defects in Solids Pub Date : 2024-04-24 DOI:10.1080/10420150.2024.2318731

Indrani Mishra, Shalik R. Joshi, Subrata Majumder, Shikha Varma

引用次数: 0

Abstract

Here we study the roughening behavior, scaling properties and the wetting nature of the Silicon surfaces that have been irradiated with 3 keV Ar ions. These surfaces illustrate the formation of nan...

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探索粗糙硅表面的润湿和缩放行为

在这里，我们研究了经过 3 keV Ar 离子照射的硅表面的粗化行为、缩放特性和润湿性。这些表面说明了纳米...

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Radiation Effects and Defects in Solids 物理-核科学技术

CiteScore

1.60

自引率

20.00%

发文量

107

审稿时长

4 months

期刊介绍： The Journal covers a wide range of topics under radiation and plasma sciences. The range of contributions encompasses: radiation physics; radiochemistry, radiobiology and physical effects of medical irradiation, including research on radiative cell degeneration; optical, electrical and mechanical effects of radiation, and their secondary effects such as diffusion and particle emission from surfaces; plasma techniques and plasma phenomena. On plasma science the Journal covers all areas of fusion, space and low temperature plasmas.