M. Akimitsu, Y. Ohtani, H. Funaba, H. Tojo, F.A. D'Isa, H. Sasao, T. Nakano, M. Yoshida
{"title":"Performance of JT-60SA Thomson Scattering data analysis system","authors":"M. Akimitsu, Y. Ohtani, H. Funaba, H. Tojo, F.A. D'Isa, H. Sasao, T. Nakano, M. Yoshida","doi":"10.1088/1748-0221/19/04/c04011","DOIUrl":null,"url":null,"abstract":"\n We have developed signal processing routines for the Thomson Scattering measurement, which is planned for use in the next campaign of the JT-60SA large-scale tokamak experiment.\nThis paper provides the data analysis system and its performance evaluated in terms of computation time and error.\nThe sequential routine of determining the scattered light intensity from a simulated signal, including noise data from a 1 Gs/s high-speed sampling digitizer, and determining the electron temperature and density was tested for the first time on an actual machine.\nThe data analysis system ensures that electron temperature and density can be calculated with reasonable relative errors and within a realistic time frame for operations on JT-60SA.","PeriodicalId":507814,"journal":{"name":"Journal of Instrumentation","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Instrumentation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/1748-0221/19/04/c04011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We have developed signal processing routines for the Thomson Scattering measurement, which is planned for use in the next campaign of the JT-60SA large-scale tokamak experiment.
This paper provides the data analysis system and its performance evaluated in terms of computation time and error.
The sequential routine of determining the scattered light intensity from a simulated signal, including noise data from a 1 Gs/s high-speed sampling digitizer, and determining the electron temperature and density was tested for the first time on an actual machine.
The data analysis system ensures that electron temperature and density can be calculated with reasonable relative errors and within a realistic time frame for operations on JT-60SA.