Comparative Investigation of Pressure Effect on Structural Stability, Electronic and Optical Response of LaXO3 (X = Al, In, Ga) for Optoelectronic Applications

Muhammad Moin, A. Anwar, Mehrunisa Babar, Udayabhaskararao Thumu, Anwar Ali
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Abstract

A first principle study intense on the density functional theory with Heydscuseria-Ernzerhof screened hybrid functional hybrid function (HSEO6) is used to assess the structural, Electronic, elastic, mechanical and optical responses of LaXO3 (X = Al, In, Ga) perovskite materials. The compressive investigation under the external static isotropic pressure (P= 0 to 80GaP), phase stability, band structure and their important impact on the optical response of LaAlO3, LaInO3 and LaGaO3. Electronic band structure shows that LaXO3 (X = Al, In Ga) semiconductor with indirect band gap and an optically inactive response up to 20GPa, while the band gap becomes direct at 80GaP. There are gamma points (G-X-Q) at 80GPa and the band gap changes from indirect to direct nature. Under main desperation physical parameters of perovskite materials are well explained the response of TDOS, PDOS and EPDOS contour plots have been well understood for the full description of the band gap. It is further observed that the external pressure enhanced upto 40GPa both materials are significantly more mechanically stable compared to pristine LaXO3 (X = Al, In, Ga) at 0GPa. The optical properties of LaAlO3, LaGaO3 and LaInO3, dielectric coefficient 1, iε2) have been employed along with the optical responses like absorption, energy loss function, reflectivity and reflective index are obtained in the energy scale from 0 to 60 eV. It was observed that static dielectric constant decreases with the decrease in optical band gap. The optical tunings under the effect of pressure which are good candidates in practical optoelectronic applications are extensively used and interpreted by the calculation of the dielectric function.
压力对用于光电应用的 LaXO3(X = Al、In、Ga)结构稳定性、电子和光学响应影响的比较研究
利用密度泛函理论与海德斯库舍-恩泽霍夫筛选杂化函数(HSEO6)的第一原理研究,评估了 LaXO3(X = Al、In、Ga)包晶材料的结构、电子、弹性、机械和光学响应。通过对外部静态各向同性压力(P= 0 至 80GaP)、相稳定性、带状结构及其对 LaAlO3、LaInO3 和 LaGaO3 光学响应的重要影响进行压缩研究。电子能带结构显示,LaXO3(X = Al、In Ga)半导体具有间接能带间隙,在 20GPa 以下无光学响应,而在 80GaP 时能带间隙变为直接。在 80GPa 时存在伽马点 (G-X-Q),带隙从间接性质变为直接性质。透辉石材料的主要物理参数得到了很好的解释,TDOS、PDOS 和 EPDOS 等值线图的响应也得到了很好的理解,从而全面描述了带隙。进一步观察发现,外部压力增强到 40GPa 时,与 0GPa 时的原始 LaXO3(X = Al、In、Ga)相比,两种材料的机械稳定性都明显提高。在 0 至 60 eV 的能量范围内,采用了 LaAlO3、LaGaO3 和 LaInO3 的光学特性、介电常数(ε1、iε2)以及吸收、能量损失函数、反射率和反射系数等光学响应。结果表明,静态介电常数随着光带隙的减小而减小。通过计算介电常数,可以广泛应用和解释压力作用下的光学调谐,这在实际光电应用中是很好的选择。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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