Tsutomu Araki, Ryosuke Nakamura, Naoki Goto, S. Mouri
{"title":"Microstructural Characterization of InN Growth Process by RF-MBE","authors":"Tsutomu Araki, Ryosuke Nakamura, Naoki Goto, S. Mouri","doi":"10.2472/jsms.73.351","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":17390,"journal":{"name":"Journal of The Society of Materials Science, Japan","volume":"315 3","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of The Society of Materials Science, Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2472/jsms.73.351","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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