Novel combined Shewhart-CUmulative EWMA-SUM mean charts without- and with measurement error

Tahir Munir, Fahad M. Alqahtani, A. Alrashidi, Abdu R Rahman, S. A. Cheema, Yi Li
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Abstract

The precision of process monitoring often encounters challenges in determining the exact shift size. Therefore, combined control charts have gained considerable attention because of their excellent speed to detect simultaneously small-to-moderate and large-size shifts. The effectiveness of the applied quality control methods strongly depends on the performance of the measurement system. Measurement error presence contributes significantly negatively toward the performance of the usual control charting schemes. This article proposes novel two-sided combined Shewhart-Cumulative EWMA-sum (Shewhart-CUESUM) control charts designed to efficiently monitor the mean of normally distributed processes. In addition, to address measurement errors, the M-Shewhart-CUESUM chart is proposed, incorporating an additive measurement error model. Evaluation of the charts through Monte-Carlo simulations, considering metrics such as average run length (ARL), extra quadratic loss, relative ARL, and performance comparison index. It is found that the combined Shewhart-CUESUM outperforms than CUESUM chart. The results show that the presence of measurement errors can significantly diminish the charts’ performance, which can be mitigated by utilizing a multiple measurements scheme. Among the different well-established combined charts examined, the M-Shewhart-CUESUM chart shows considerably more sensitive to detecting simultaneously detect small and large size shifts. To employ simulated datasets to illustrate the impact of measurement errors and demonstrate the implications of the proposed charts on process mean shifts.
无测量误差和有测量误差的新颖组合 Shewhart-CUmulative EWMA-SUM 均值图
过程监控的精确性在确定准确的班次大小时经常会遇到挑战。因此,组合控制图因其同时检测中小规模和大规模转变的出色速度而备受关注。质量控制方法的有效性在很大程度上取决于测量系统的性能。测量误差的存在严重影响了常规控制图方案的性能。本文提出了新颖的双面组合 Shewhart-Cumulative EWMA-sum (Shewhart-CUESUM) 控制图,旨在有效监控正态分布过程的平均值。此外,为了解决测量误差问题,还提出了 M-Shewhart-CUESUM 控制图,其中包含一个测量误差加法模型。通过蒙特卡洛模拟,考虑平均运行长度(ARL)、额外二次损失、相对 ARL 和性能比较指数等指标,对控制图进行评估。结果发现,Shewhart-CUESUM 组合图表的性能优于 CUESUM 图表。结果表明,测量误差的存在会大大降低图表的性能,而利用多重测量方案则可以缓解这一问题。在所研究的各种成熟的组合图表中,M-Shewhart-CUESUM 图表在同时检测小尺寸和大尺寸偏移方面显示出更高的灵敏度。利用模拟数据集来说明测量误差的影响,并展示所建议的图表对过程均值偏移的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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