Chunlin Hao, Hao Xu, Shiquan Lin, Yaju Zhang, Jinmiao He, Bei Liu, Yuanzheng Zhang, Banghao Wu, Guozhen Shen, Haiwu Zheng
{"title":"A universal calibration method for eliminating topography-dependent current in conductive AFM and its application in nanoscale imaging","authors":"Chunlin Hao, Hao Xu, Shiquan Lin, Yaju Zhang, Jinmiao He, Bei Liu, Yuanzheng Zhang, Banghao Wu, Guozhen Shen, Haiwu Zheng","doi":"10.1007/s12274-024-6651-0","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":508036,"journal":{"name":"Nano Research","volume":"52 25","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nano Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s12274-024-6651-0","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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