Investigation of Partial Discharge Characteristics inside Vacuum Interrupter with Various Floating Shield Potentials

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Khin Yadana Kyaw, Yusuke Nakano, Yasunori Tanaka, Tatsuo Ishijima, Shusaku Nakano, Masato Kobayashi
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Abstract

The reliable operation of vacuum circuit breakers (VCBs) plays an important role in the power system's reliability. The common cases which lead to the failure in the VCB are related to the loss of vacuum inside the vacuum interrupters (VIs). VIs commonly loses the vacuum with a higher leakage rate, resulting in a decrease in discharge voltage and partial discharge (PD) inside the VI which can lead to the eventual failure of the VCBs. Detecting vacuum leakage at the early stage became an important issue. In the prior study, vacuum failure was studied by detecting PD characteristics inside the VIs by regulating the different internal pressures. This study introduces a novel approach to investigating vacuum leakage within the VIs by detecting PD characteristics under various floating shield potentials to study the possibility of shield potential control on PD measurement. Comparing the experimental results measured at different internal pressures under various shield potentials, this study highlights the measurement of PD characteristics and the possibility of shield potential control on PD measurement. © 2024 Institute of Electrical Engineers of Japan and Wiley Periodicals LLC.

各种浮动屏蔽电位下真空灭弧室内部局部放电特性的研究
真空断路器(VCB)的可靠运行对电力系统的可靠性起着重要作用。导致真空断路器发生故障的常见原因与真空灭弧室(VI)内部失去真空有关。真空断路器通常会以较高的泄漏率失去真空,导致放电电压降低和真空断路器内部局部放电(PD),最终导致 VCB 故障。在早期阶段检测真空泄漏成为一个重要问题。在之前的研究中,通过调节不同的内部压力来检测 VI 内部的局部放电特性,从而研究真空失效。本研究引入了一种新方法,通过检测不同浮动屏蔽电位下的 PD 特性来研究 VI 内部的真空泄漏,从而研究屏蔽电位控制对 PD 测量的影响。通过比较各种屏蔽电位下不同内部压力测量的实验结果,本研究强调了 PD 特性的测量以及屏蔽电位控制对 PD 测量的影响。© 2024 日本电气工程师学会和 Wiley Periodicals LLC。
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来源期刊
IEEJ Transactions on Electrical and Electronic Engineering
IEEJ Transactions on Electrical and Electronic Engineering 工程技术-工程:电子与电气
CiteScore
2.70
自引率
10.00%
发文量
199
审稿时长
4.3 months
期刊介绍: IEEJ Transactions on Electrical and Electronic Engineering (hereinafter called TEEE ) publishes 6 times per year as an official journal of the Institute of Electrical Engineers of Japan (hereinafter "IEEJ"). This peer-reviewed journal contains original research papers and review articles on the most important and latest technological advances in core areas of Electrical and Electronic Engineering and in related disciplines. The journal also publishes short communications reporting on the results of the latest research activities TEEE ) aims to provide a new forum for IEEJ members in Japan as well as fellow researchers in Electrical and Electronic Engineering from around the world to exchange ideas and research findings.
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