High-quality single InGaAs/GaAs quantum dot growth on a silicon substrate for quantum photonic applications

Abstract

Developing non-classical light sources for use in quantum information technology is a primary goal of quantum nanophotonics. Significant progress has been made in this area using quantum dots grown on III/V semiconductor substrates. However, it is crucial to develop quantum light sources based on silicon wafers to facilitate large-scale integration of electronic circuits and quantum photonic structures. We present a method for the direct heteroepitaxial growth of high-quality InGaAs quantum dots on silicon, which enables the fabrication of scalable and cost-effective quantum photonics devices that are compatible with silicon technology. To achieve high-quality GaAs heterostructures, we apply an intermediate GaP buffer and defect-reducing layers on a silicon substrate. The epitaxially grown quantum dots exhibit optical and quantum-optical properties similar to reference ones based on conventional GaAs substrates. The distributed Bragg reflector used as a backside mirror enables us to achieve bright emission with up to (18 ± 1)% photon extraction efficiency. Additionally, the quantum dots exhibit strong multi-photon suppression with g⁽²⁾(τ) = (3.7 ± 0.2) × 10⁻² and high photon indistinguishability V = (66 ± 19)% under non-resonant excitation. These results indicate the high potential of our heteroepitaxy approach in the field of silicon-compatible quantum nanophotonics. Our approach can pave the way for future chips that combine electronic and quantum photonic functionality.