New Trends in Testing Electronic Products by Simulation During Design Using Programmable Rules, Circuit Analysis and AI

Y. Bot, A. Segal
{"title":"New Trends in Testing Electronic Products by Simulation During Design Using Programmable Rules, Circuit Analysis and AI","authors":"Y. Bot, A. Segal","doi":"10.1109/RAMS51492.2024.10457651","DOIUrl":null,"url":null,"abstract":"This article presents new trends in testing electronic products during design using simulation, programmable rules, circuit analysis, and artificial intelligence (AI). The paper highlights how these innovative techniques can improve the accuracy and efficiency of testing electronic products, reducing development time and costs while ensuring product reliability and safety. The article begins by discussing the limitations of traditional physical testing methods, including the high costs and long lead times required to develop and test prototypes. The paper then explains how simulation testing can overcome these limitations, allowing for more accurate testing under different scenarios and conditions, without the need for physical prototypes. The article provides an overview of the different types of simulations that can be used in product development. The paper also discusses the use of programmable rules in simulation testing, which allows for the creation of specific testing protocols and rules to improve the accuracy of testing. Furthermore, the article highlights the role of AI in simulation testing, which can be used to optimize simulation models, identify design flaws, and reduce the risk of errors and failures. The paper also discusses the challenges involved in using AI in simulation testing and provides practical recommendations to mitigate them. The paper concludes by emphasizing the importance of integrating simulation testing into the overall product development process, as well as the need for collaboration and communication between stakeholders, including developers, testers, and customers, to ensure that testing requirements are clearly defined and agreed upon. In conclusion, this article presents new trends in testing electronic products during design using simulation, programmable rules, circuit analysis, and AI. The paper highlights the benefits of these innovative techniques, including reduced costs, improved accuracy of testing, and the ability to simulate extreme conditions, thereby ensuring the reliability and safety of electronic products.","PeriodicalId":518362,"journal":{"name":"2024 Annual Reliability and Maintainability Symposium (RAMS)","volume":"118 3","pages":"1-7"},"PeriodicalIF":0.0000,"publicationDate":"2024-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2024 Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS51492.2024.10457651","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This article presents new trends in testing electronic products during design using simulation, programmable rules, circuit analysis, and artificial intelligence (AI). The paper highlights how these innovative techniques can improve the accuracy and efficiency of testing electronic products, reducing development time and costs while ensuring product reliability and safety. The article begins by discussing the limitations of traditional physical testing methods, including the high costs and long lead times required to develop and test prototypes. The paper then explains how simulation testing can overcome these limitations, allowing for more accurate testing under different scenarios and conditions, without the need for physical prototypes. The article provides an overview of the different types of simulations that can be used in product development. The paper also discusses the use of programmable rules in simulation testing, which allows for the creation of specific testing protocols and rules to improve the accuracy of testing. Furthermore, the article highlights the role of AI in simulation testing, which can be used to optimize simulation models, identify design flaws, and reduce the risk of errors and failures. The paper also discusses the challenges involved in using AI in simulation testing and provides practical recommendations to mitigate them. The paper concludes by emphasizing the importance of integrating simulation testing into the overall product development process, as well as the need for collaboration and communication between stakeholders, including developers, testers, and customers, to ensure that testing requirements are clearly defined and agreed upon. In conclusion, this article presents new trends in testing electronic products during design using simulation, programmable rules, circuit analysis, and AI. The paper highlights the benefits of these innovative techniques, including reduced costs, improved accuracy of testing, and the ability to simulate extreme conditions, thereby ensuring the reliability and safety of electronic products.
在设计过程中使用可编程规则、电路分析和人工智能模拟测试电子产品的新趋势
本文介绍了在设计过程中利用仿真、可编程规则、电路分析和人工智能(AI)测试电子产品的新趋势。文章重点介绍了这些创新技术如何提高电子产品测试的准确性和效率,减少开发时间和成本,同时确保产品的可靠性和安全性。文章首先讨论了传统物理测试方法的局限性,包括开发和测试原型所需的高成本和较长的交付周期。然后,文章解释了模拟测试如何克服这些局限性,在不同场景和条件下进行更精确的测试,而无需物理原型。文章概述了可用于产品开发的不同模拟类型。文章还讨论了在模拟测试中使用可编程规则的问题,这种方法可以创建特定的测试协议和规则,从而提高测试的准确性。此外,文章还强调了人工智能在仿真测试中的作用,它可用于优化仿真模型、识别设计缺陷以及降低错误和故障风险。文章还讨论了在仿真测试中使用人工智能所面临的挑战,并提供了切实可行的建议来缓解这些挑战。最后,本文强调了将仿真测试整合到整个产品开发流程中的重要性,以及开发人员、测试人员和客户等利益相关者之间协作和沟通的必要性,以确保测试要求得到明确定义并达成一致。总之,本文介绍了在设计过程中使用模拟、可编程规则、电路分析和人工智能测试电子产品的新趋势。文章重点介绍了这些创新技术的优势,包括降低成本、提高测试精度和模拟极端条件的能力,从而确保电子产品的可靠性和安全性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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