On Decomposing Complex Test Cases for Efficient Post-silicon Validation

C. Harshitha, Sundarapalli Harikrishna, Peddakotla Rohith, Sandeep Chandran, Rajshekar Kalayappan
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Abstract

In post-silicon validation, the first step when an erroneous behavior is uncovered by a long-running test case is to reproduce the observed behavior in a shorter execution. This makes it amenable to use a variety of tools and techniques to debug the error. In this work, we propose a tool called Gru, that takes a long execution trace as input and generates a set of executables, one for each section of the trace. Each generated executable is guaranteed to faithfully replicate the behavior observed in the corresponding section of the original, complex test case independently. This enables the generated executables to be run simultaneously across different silicon samples, thereby allowing further debugging activities to proceed in parallel. The generation of executables does not require the source code of the complex test case and hence supports privacy-aware debugging in scenarios involving sensitive Intellectual Properties (IPs). We demonstrate the effectiveness of this tool on a collection of 10 EEMBC benchmarks that are executed on a bare-metal LEON3 SoC.
分解复杂测试用例,实现高效硅后验证
在硅片后期验证中,当长期运行的测试用例发现错误行为时,第一步就是在较短的执行时间内重现观察到的行为。这样就可以使用各种工具和技术来调试错误。在这项工作中,我们提出了一种名为 Gru 的工具,它将长执行跟踪作为输入,并生成一组可执行文件,跟踪的每一部分都有一个可执行文件。保证生成的每个可执行文件都能忠实复制在原始复杂测试用例的相应部分中观察到的行为。这样,生成的可执行文件就能在不同的硅片样本中同时运行,从而允许进一步的调试活动并行进行。可执行文件的生成不需要复杂测试用例的源代码,因此支持在涉及敏感知识产权(IP)的情况下进行隐私感知调试。我们在裸机 LEON3 SoC 上执行的 10 个 EEMBC 基准集合上演示了该工具的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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