Early Detection of Failure in Solid State Devices Using 4 Corner Targeted Testing

Ayswarya Rajagopalan, Bradley Guerke, Jimmy Jun-Min Yang
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Abstract

The 4-Corner testing suite (4C) validates the drive's ability to perform under stress by cycling the drive through four extreme corners of thermal and voltage stress (4C- TVS) and periodic sudden power loss at temperature (4C-SPL), all while stressing the drive with workload. The test conditions such as voltage fluctuations, temperature above the product specification are the accelerating factors that simulates the real-world failures that the drive may encounter during product life cycle. The early phases of testing firmware maturity rely on bench validation tests to evaluate the stability of the firmware. These tests are targeted tests that validate the system as a whole unit and may not cover the temperature and voltage ranges that the drives are specified for including margins. Running the 4C-tests during the early phase of the project helps to uncover issues that may remain unnoticed until later phases of the project. Reliability SSD validation cycle involves testing the stability and performance of the drive or DUT at various stages of product development. There are 4 stages identified in line with the product maturity that are Pre-Engineering verification Testing (Pre-EVT), Engineering Verification Testing (EVT), Design Verification Testing (DVT) and Reliability Demonstration Test (RDT). Various tests are run at each stage of product development to identify issues, debug failures, and validate the fix. This process is repeated until the product is stable. The time between the Pre-EVT and DVT phase is about six months. The benefit of the 4C testing suite during the early firmware development phases such as Pre- Evt has seen an increased improvement in product stability. Early discovery allows for more comprehensive firmware and hardware solutions and better validation. •Reduces the debug time in later stages of the product development where issues are more complex to fix. •Lesser surprise failures in later stages of the product. •Better stability and confidence in the product. The target tests during the pre- EVT phase are bench validation test that test the drive feature by feature on limited drive population. The 4C tests on the other hand test the drive as a whole entity on larger volume of drives. The increased drive count and stressful environment increases the possibility of catching the failures as compared to bench validation tests. In one of the product evaluations, 4C was run during the pre-EVT phase. The run detected many failures such as power failures, bad block count increase, firmware issues etc., that were not caught by the bench validation tests. The issues uncovered during the run helped in improving the bench validation tests and increased overall quality of the product.
利用 4 角定向测试及早检测固态器件故障
4 角测试套件 (4C) 通过对硬盘进行四个极端角的热和电压压力循环测试(4C- TVS)以及温度下的周期性突然功率损耗测试(4C-SPL),验证硬盘在压力下的性能,同时对硬盘的工作负载施加压力。电压波动、高于产品规格的温度等测试条件是模拟硬盘在产品生命周期中可能遇到的实际故障的加速因素。测试固件成熟度的早期阶段依靠工作台验证测试来评估固件的稳定性。这些测试是有针对性的测试,将系统作为一个整体进行验证,可能无法涵盖硬盘指定的温度和电压范围,包括余量。在项目的早期阶段进行 4C 测试有助于发现项目后期阶段才会注意到的问题。可靠性 SSD 验证周期包括在产品开发的各个阶段测试驱动器或 DUT 的稳定性和性能。根据产品成熟度可分为四个阶段,即工程前验证测试(Pre-EVT)、工程验证测试(EVT)、设计验证测试(DVT)和可靠性演示测试(RDT)。在产品开发的每个阶段都要进行各种测试,以发现问题、调试故障和验证修复。这一过程不断重复,直到产品稳定为止。Pre-EVT 和 DVT 阶段之间的时间大约为六个月。在早期固件开发阶段(如 Pre-EVT)使用 4C 测试套件可提高产品稳定性。早期发现可以提供更全面的固件和硬件解决方案以及更好的验证。-减少产品开发后期的调试时间,因为后期的问题修复更为复杂。-减少产品后期阶段的意外故障。-提高产品的稳定性和可信度。EVT 前期阶段的目标测试是在有限的驱动器群上逐一测试驱动器功能的台架验证测试。而 4C 测试则是在更大容量的硬盘上对硬盘进行整体测试。与台架验证测试相比,增加的硬盘数量和紧张的环境增加了发现故障的可能性。在一次产品评估中,4C 在预 EVT 阶段运行。运行过程中发现了许多故障,如电源故障、坏块数增加、固件问题等,这些都是工作台验证测试没有发现的。运行过程中发现的问题有助于改进工作台验证测试,提高产品的整体质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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