A Fast Test Compaction Method for Commercial DFT Flow Using Dedicated Pure-MaxSAT Solver

Abstract

Minimizing the testing cost is crucial in the context of the design for test (DFT) flow. In our observation, the test patterns generated by commercial ATPG tools in test compression mode still contain redundancy. To tackle this obstacle, we propose a post-flow static test compaction method that utilizes a partial fault dictionary instead of a full fault dictionary, and leverages a dedicated Pure-MaxSAT solver to re-compact the test patterns generated by commercial ATPG tools. We also observe that commercial ATPG tools offer a more comprehensive selection of candidate patterns for compaction in the “n-detect” mode, leading to superior compaction efficacy. In experiments on ISCAS89, ITC99, and open-source RISC-V CPU benchmarks, our method achieves an average reduction of 21.58% and a maximum of 29.93% in test cycles evaluated by commercial tools while maintaining fault coverage. Furthermore, our approach demonstrates improved performance compared with existing methods.