Multi-beam phase mask optimization for holographic volumetric additive manufacturing

C. Li, J. Toombs, Vivek Subramanian, H. Taylor
{"title":"Multi-beam phase mask optimization for holographic volumetric additive manufacturing","authors":"C. Li, J. Toombs, Vivek Subramanian, H. Taylor","doi":"10.1117/12.3023424","DOIUrl":null,"url":null,"abstract":"The capability of holography to project three-dimensional (3D) images and correct for aberrations offers much potential to enhance optical control in light-based 3D printing. Notably, multi-beam multi-wavelength holographic systems represent an important development direction for advanced volumetric additive manufacturing (VAM). Nonetheless, searching for the optimal 3D holographic projection is a challenging ill-posed problem due to the physical constraints involved. This work introduces an optimization framework to search for the optimal set of projection parameters, namely phase modulation values and amplitudes, for multi-beam holographic lithography. The proposed framework is more general than classical phase retrieval algorithms in the sense that it can simultaneously optimize multiple holographic beams and model the coupled non-linear material response created by co-illumination of the holograms. The framework incorporates efficient methods to evaluate holographic light fields, resample quantities across coordinate grids, and compute the coupled exposure effect. The efficacy of this optimization method is tested for a variety of setup configurations that involve multi-wavelength illumination, two-photon absorption, and time-multiplexed scanning beam. A special test case of holo-tomographic patterning optimized 64 holograms simultaneously and achieved the lowest error among all demonstrations. This variant of tomographic VAM shows promises for achieving high-contrast microscale fabrication. All testing results indicate that a fully coupled optimization offers superior solutions relative to a decoupled optimization approach.","PeriodicalId":517870,"journal":{"name":"Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XVII","volume":"322 4","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XVII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.3023424","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The capability of holography to project three-dimensional (3D) images and correct for aberrations offers much potential to enhance optical control in light-based 3D printing. Notably, multi-beam multi-wavelength holographic systems represent an important development direction for advanced volumetric additive manufacturing (VAM). Nonetheless, searching for the optimal 3D holographic projection is a challenging ill-posed problem due to the physical constraints involved. This work introduces an optimization framework to search for the optimal set of projection parameters, namely phase modulation values and amplitudes, for multi-beam holographic lithography. The proposed framework is more general than classical phase retrieval algorithms in the sense that it can simultaneously optimize multiple holographic beams and model the coupled non-linear material response created by co-illumination of the holograms. The framework incorporates efficient methods to evaluate holographic light fields, resample quantities across coordinate grids, and compute the coupled exposure effect. The efficacy of this optimization method is tested for a variety of setup configurations that involve multi-wavelength illumination, two-photon absorption, and time-multiplexed scanning beam. A special test case of holo-tomographic patterning optimized 64 holograms simultaneously and achieved the lowest error among all demonstrations. This variant of tomographic VAM shows promises for achieving high-contrast microscale fabrication. All testing results indicate that a fully coupled optimization offers superior solutions relative to a decoupled optimization approach.
全息体积增材制造的多光束相位掩模优化
全息技术能够投射三维(3D)图像并校正像差,这为增强光基 3D 打印的光学控制提供了巨大潜力。值得注意的是,多光束多波长全息系统代表了先进体积增材制造(VAM)的一个重要发展方向。然而,由于涉及物理约束,寻找最佳三维全息投影是一个具有挑战性的难题。这项工作引入了一个优化框架,用于搜索多光束全息光刻技术的最佳投影参数集,即相位调制值和振幅。所提出的框架比经典的相位检索算法更具通用性,因为它可以同时优化多个全息光束,并对全息图共同照明产生的耦合非线性材料响应进行建模。该框架结合了评估全息光场、跨坐标网格重采样和计算耦合曝光效应的有效方法。该优化方法的功效针对多种设置配置进行了测试,包括多波长照明、双光子吸收和时间多路扫描光束。一个全息层析成像图案的特殊测试案例同时优化了 64 幅全息图,在所有演示中误差最小。这种层析 VAM 变体有望实现高对比度的微尺度制造。所有测试结果表明,完全耦合的优化方法比解耦优化方法提供了更优越的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信