Patrik Zajec, Jože M. Rožanec, Spyros Theodoropoulos, Mihail Fontul, Erik Koehorst, B. Fortuna, Dunja Mladenić
{"title":"Few-shot learning for defect detection in manufacturing","authors":"Patrik Zajec, Jože M. Rožanec, Spyros Theodoropoulos, Mihail Fontul, Erik Koehorst, B. Fortuna, Dunja Mladenić","doi":"10.1080/00207543.2024.2316279","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":506250,"journal":{"name":"International Journal of Production Research","volume":"78 11","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-02-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Production Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/00207543.2024.2316279","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}