Phillip A. Laplante
{"title":"Exploring Reliability","authors":"Phillip A. Laplante","doi":"10.1109/mrl.2024.3358149","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517825,"journal":{"name":"IEEE Reliability Magazine","volume":"55 5","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Reliability Magazine","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mrl.2024.3358149","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
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