Magneto-Conductive and Magnetic Properties in La1-xSrxMnO3 Thin Films on a-SiO2 Substrates Produced by Metal Organic Decomposition Method

Sara Kawaguchi, Kohei Hamada, Hiromi Kobori, Toshifumi Taniguchi, Tetsuo Shimizu
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Abstract

We have studied magneto-conductive and magnetic properties of La1-xSrxMnO3 (LSMO) thin films on a-SiO2 substrates produced by the metal organic decomposition (MOD) method. LSMO thin films for x = 0, 0.15 and 0.3 have been produced in a pure O2 gas atmosphere. Although LaMnO3 (LMO) single crystal is an antiferromagnetic insulator (AFI), LMO thin films we have produced show ferromagnetic metal (FM) properties for suitable heat treatment conditions. We consider that the excess of O2- ions in LMO thin films produced in a pure O2 gas atmosphere induces the strong hole self-doping into those and the LMO thin films change from AFI to FM. Whereas, the ordinary hole doping is also occurred in LSMO thin films at x > 0. Thus, the carrier doping for LSMO thin films at x > 0 is caused by the hole self-doping by O2- ions and the ordinary hole doping by the replacement of La3+ ions by Sr2+ ones. To investigate the crystallographic and surface structures of the LSMO thin films, X-ray diffraction and SEM measurements have been performed, respectively. From the X-ray diffraction measurement, we have found that all LSMO thin films have perovskite structure and are polycrystalline. From the SEM measurement, we have seen that the LSMO thin films are formed of the aggregation of LSMO fine particles. Electrical resistivities (ERs) and magneto-resistivity (MR) ratios of the LSMO thin films have been measured on the temperature dependence (4K-300K). From MR ratio measurements, the coercive forces of them have been obtained as a function of temperature, and the Curie temperatures have been estimated from the temperature dependences of the coercive forces. We have discussed the origin of the magneto-conductive and magnetic properties of LSMO thin films.
金属有机分解法制备的 a-SiO2 基质上 La1-xSrxMnO3 薄膜的磁导和磁性能
我们研究了通过金属有机分解(MOD)方法在 a-SiO2 基底上制备的 La1-xSrxMnO3 (LSMO)薄膜的导磁和磁性能。x = 0、0.15 和 0.3 的 LSMO 薄膜是在纯氧气环境下生产的。虽然 LaMnO3(LMO)单晶是一种反铁磁绝缘体(AFI),但我们生产的 LMO 薄膜在合适的热处理条件下显示出铁磁金属(FM)特性。我们认为,在纯 O2 气体环境中制备的 LMO 薄膜中过量的 O2- 离子诱导了强空穴自掺杂,从而使 LMO 薄膜从反铁磁绝缘体转变为铁磁金属。因此,x > 0 时 LSMO 薄膜的载流子掺杂是由 O2- 离子的空穴自掺杂和 Sr2+ 离子取代 La3+ 离子的普通空穴掺杂引起的。为了研究 LSMO 薄膜的晶体结构和表面结构,分别进行了 X 射线衍射和扫描电镜测量。通过 X 射线衍射测量,我们发现所有 LSMO 薄膜都具有包晶结构,并且都是多晶体。通过扫描电镜测量,我们发现 LSMO 薄膜是由 LSMO 微粒聚集而成的。我们测量了 LSMO 薄膜的电阻率(ER)和磁阻率(MR),它们与温度有关(4K-300K)。根据磁阻比测量结果,得出了它们的矫顽力与温度的函数关系,并根据矫顽力的温度相关性估算出居里温度。我们讨论了 LSMO 薄膜磁导和磁性能的起源。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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