Effect of Gamma Irradiation on Structural and Optical Properties of CdMnTe Epitaxial Thin Films

A. Mekhrabov, Matanat Mehrabova
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Abstract

Cd1-0.06Mn0.06Te epitaxial thin films were synthesis on glass substrates by the Molecular Beam Condensation (MBC) method in the vacuum evaporation equipment УВН-71-ПЗ with steam-oil pumping and nitrogen trap at working pressure of residual gas (1÷2)x10-4 Pa. By using additional source of Te vapor and controlling temperature, it has been determined the optimum conditions for obtaining Cd1-0.06Mn0.06Te epitaxial films with a perfect structure, clean and smooth surface, without of second phase inclusions. XRD investigations showed that Cd1-0.06Mn0.06Te epitaxial films grow on glass substrates on the (111) plane of the face-centered cubic lattice with the lattice parameter of a = 6.481 Å. Effect of γ-irradiation on XRD spectra of Cd1-0.06Mn0.06Te epitaxial films reveals that, XRD patterns of initial and γ-irradiated samples did not show any phase transformations, however there is a variation in relative intensities of diffraction peaks. It has been found that Cd1-0.06Mn0.06Te epitaxial films with a film thickness of d=15 µm, absorb light up to a wavelength of λ=765 nm and at λ>765 nm the absorption begins to gradually decrease and then the material becomes transparent. The obtained results indicate that Cd1-0.06Mn0.06Te epitaxial films absorb light quanta in the visible and infrared spectral regions. Iirradiation of Cd1-0.06Mn0.06Te epitaxial films with γ rays at low irradiation doses leads to a change in the optical parameters, the profile of the spectrum curves and the intrinsic absorption edge. In additions to experimental studies, a theoretical ab initio calculations of band structure (BS) of ideal and defective semiconductors of Cd1-0.06Mn0.06Te has been also carried out by using Density Functional Theory (DFT) method via Atomistix ToolKit computer program. The band gap energy has been calculated as Eg = 1.6 eV for ferromagnetic (FM) and Eg = 1.7 eV for antiferromagnetic (AFM) state of Cd1-0.06Mn0.06Te compound. The results of theoretical calculations on the band gap energy of ideal and defective Cd1-0.06Mn0.06Te semiconductors are in a good agreement with experimental findings.
伽马辐照对碲化镉外延薄膜结构和光学特性的影响
在真空蒸发设备УВН-71-ПЗ中采用分子束冷凝(MBC)法在玻璃基片上合成了Cd1-0.06Mn0.06Te外延薄膜,该设备配有蒸汽-油泵和氮气捕集器,残余气体工作压力为(1÷2)x10-4 Pa。通过使用额外的 Te 蒸汽源和控制温度,确定了获得 Cd1-0.06Mn0.06Te 外延薄膜的最佳条件,这些薄膜具有完美的结构、清洁光滑的表面和无第二相夹杂物。XRD 研究表明,Cd1-0.06Mn0.06Te 外延薄膜生长在玻璃基底上的面心立方晶格 (111) 平面上,晶格参数为 a = 6.481 Å。06Mn0.06Te 外延薄膜的 XRD 图谱显示,初始样品和经过 γ 辐照的样品没有发生任何相变,但衍射峰的相对强度有所变化。研究发现,薄膜厚度为 d=15 µm 的 Cd1-0.06Mn0.06Te 外延薄膜在波长为 λ=765 nm 时吸收光,在 λ>765 nm 时,吸收开始逐渐减少,然后材料变得透明。研究结果表明,Cd1-0.06Mn0.06Te 外延薄膜能吸收可见光和红外光谱区的光量子。用低剂量的γ射线辐照 Cd1-0.06Mn0.06Te 外延薄膜会导致光学参数、光谱曲线轮廓和本征吸收边缘发生变化。除了实验研究之外,我们还通过 Atomistix ToolKit 计算机程序,使用密度泛函理论(DFT)方法对 Cd1-0.06Mn0.06Te 理想半导体和缺陷半导体的能带结构(BS)进行了理论非初始计算。计算得出 Cd1-0.06Mn0.06Te 化合物的铁磁(FM)态带隙能 Eg = 1.6 eV,反铁磁(AFM)态带隙能 Eg = 1.7 eV。理想和缺陷 Cd1-0.06Mn0.06Te 半导体带隙能的理论计算结果与实验结果非常吻合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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