Shiva Shankar Reddy, V. R. Maheswara Rao, Kalidindi Sravani, Silpa Nrusimhadri
{"title":"Image quality evaluation: evaluation of the image quality of actual images by using machine learning models","authors":"Shiva Shankar Reddy, V. R. Maheswara Rao, Kalidindi Sravani, Silpa Nrusimhadri","doi":"10.11591/eei.v13i2.5947","DOIUrl":null,"url":null,"abstract":"Evaluating image features is a significant step in image processing in applications like number plate detection, vehicle tracking and many image processing-based applications. Image processing-based applications need accurate parts to get the best outcomes. Feature detection is done based on various feature detection techniques. The proposed system aims to get the best feature detector based on the input images by evaluating the image features. For assessing the image features, the proposed system worked on various descriptors like oriented FAST and rotated brief (ORB), learned arrangements of three patch codes (LATCH), binary robust independent elementary features (BRIEF), and binary robust invariant scalable keypoints (BRISK) to extract and evaluate the features using K-nearest neighbor (KNN)-matching and retrieve the inliers of the matching. Each descriptor produces different matching features and inliers; with the matchings and inliers, the inlier ratio calculates to show the analysis. To increase performance, we also examine adding depth information to descriptors.","PeriodicalId":37619,"journal":{"name":"Bulletin of Electrical Engineering and Informatics","volume":"53 8","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Bulletin of Electrical Engineering and Informatics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.11591/eei.v13i2.5947","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Mathematics","Score":null,"Total":0}
引用次数: 0
Abstract
Evaluating image features is a significant step in image processing in applications like number plate detection, vehicle tracking and many image processing-based applications. Image processing-based applications need accurate parts to get the best outcomes. Feature detection is done based on various feature detection techniques. The proposed system aims to get the best feature detector based on the input images by evaluating the image features. For assessing the image features, the proposed system worked on various descriptors like oriented FAST and rotated brief (ORB), learned arrangements of three patch codes (LATCH), binary robust independent elementary features (BRIEF), and binary robust invariant scalable keypoints (BRISK) to extract and evaluate the features using K-nearest neighbor (KNN)-matching and retrieve the inliers of the matching. Each descriptor produces different matching features and inliers; with the matchings and inliers, the inlier ratio calculates to show the analysis. To increase performance, we also examine adding depth information to descriptors.
在车牌检测、车辆跟踪和许多基于图像处理的应用中,评估图像特征是图像处理的一个重要步骤。基于图像处理的应用需要精确的部件才能获得最佳结果。特征检测是基于各种特征检测技术完成的。所提出的系统旨在通过评估图像特征,根据输入图像获得最佳特征检测器。为了评估图像特征,所提出的系统使用了各种描述符,如定向 FAST 和旋转简图(ORB)、三个补丁代码的学习排列(LATCH)、二进制鲁棒独立基本特征(BRIEF)和二进制鲁棒不变可扩展关键点(BRISK),使用 K 近邻(KNN)匹配来提取和评估特征,并检索匹配的离群值。每个描述符都会产生不同的匹配特征和离群值;利用匹配和离群值计算离群值比率,以显示分析结果。为了提高性能,我们还研究了在描述符中添加深度信息。
期刊介绍:
Bulletin of Electrical Engineering and Informatics publishes original papers in the field of electrical, computer and informatics engineering which covers, but not limited to, the following scope: Computer Science, Computer Engineering and Informatics[...] Electronics[...] Electrical and Power Engineering[...] Telecommunication and Information Technology[...]Instrumentation and Control Engineering[...]