Carolina Blanch-Perez-del-Notario, Pieter Bertier, M. Jayapala, A. Lambrechts
{"title":"Hyperspectral microscopy as a particle exposure assessment tool","authors":"Carolina Blanch-Perez-del-Notario, Pieter Bertier, M. Jayapala, A. Lambrechts","doi":"10.1117/12.3002829","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517841,"journal":{"name":"Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXI","volume":"72 2","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXXI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.3002829","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}