Yongkun Sin, Jesse Theiss, Michael Huang, Emily Tang, Jeffrey Childs, In-Tae Bae, Adam Bushmaker
{"title":"Reliability and failure mode analysis of high-speed 850-nm multi-mode and 795-nm single-mode VCSELs for space applications","authors":"Yongkun Sin, Jesse Theiss, Michael Huang, Emily Tang, Jeffrey Childs, In-Tae Bae, Adam Bushmaker","doi":"10.1117/12.3000490","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517727,"journal":{"name":"Vertical-Cavity Surface-Emitting Lasers XXVIII","volume":"23 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Vertical-Cavity Surface-Emitting Lasers XXVIII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.3000490","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}