Optical and electrical properties of zinc oxide nanofilms deposited using the sol-gel method

A. Fedorenko, K.M. Bozhko, N. Kachur, A.V. Kosiakovskiy, V.P. Maslov
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引用次数: 1

Abstract

This paper is aimed at investigation of electrical properties inherent to zinc oxide (ZnO) nanofilms prepared using the sol-gel method. The experimental samples consisted of a substrate (25×25×1 mm) made of microscopic glass brand “Voles” covered with the above films of the thickness ranging from 50 to 150 nm. Optical characterization was performed to calculate the bandgap width and to confirm the presence of zinc oxide in the nanofilms and demonstrate their optical activity. An oscillographic method was used to measure the surface resistance of nanofilms by using a galvanic elastic contact, which allowed determining their high electrical quality and resistance. Simultaneously, the high mechanical strength of these nanofilms was ascertained under the action of the elastic contact, enduring a series of 5 to 10 measurements without noticeable changes in resistance. Measurements were also carried out to observe the change in the electrical resistance of ZnO films, when they were heated from 25 up to 100 °C. The obtained results have indicated the potential of these nanofilms for applications in the fields of electronics, photoelectronics and sensor technologies.
采用溶胶-凝胶法沉积的纳米氧化锌薄膜的光学和电学特性
本文旨在研究采用溶胶-凝胶法制备的氧化锌(ZnO)纳米薄膜的固有电气特性。实验样品由 "Voles "牌显微玻璃制成的基板(25×25×1 毫米)组成,基板上覆盖着厚度为 50 至 150 纳米的上述薄膜。光学表征的目的是计算带隙宽度,确认纳米薄膜中是否含有氧化锌,并证明其光学活性。使用振荡法测量了纳米薄膜的表面电阻,通过电弹性接触,确定了纳米薄膜的高电气质量和电阻。同时,在弹性触点的作用下,这些纳米薄膜的高机械强度也得到了证实。还进行了测量,以观察氧化锌薄膜在从 25°C 加热到 100°C 时电阻的变化。所获得的结果表明,这些纳米薄膜在电子、光电子和传感器技术领域具有应用潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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