Drift suppression of solution-gated graphene field-effect transistors through electrolyte submersion

S. Ushiba, Yuka Tokuda, Tomomi Nakano, T. Ono, Shinsuke Tani, Masahiko Kimura, Kazuhiko Matsumoto
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Abstract

In solution-gated graphene field-effect transistors (SG-GFETs), cations in electrolyte solutions can intercalate between graphene and SiO2. Such permeation affects substrate-induced hole doping effects, resulting in drifts in the charge neutrality point (CNP) of SG-GFETs. In this study, we investigated the effect of submerging GFETs in electrolyte solutions on CNP values. The results revealed that the CNP decreased considerably from approximately 180 mV to nearly zero with the increase in the immersion period. The CNP drifts during electrical measurements were also suppressed by the prolonged submersion. These insights can be used for developing improved SG-GFETs.
通过电解质浸没抑制溶液门控石墨烯场效应晶体管的漂移
在溶液门控石墨烯场效应晶体管(SG-GFET)中,电解质溶液中的阳离子会在石墨烯和二氧化硅之间发生插层。这种渗透会影响基底诱导的空穴掺杂效应,导致 SG-GFET 的电荷中性点 (CNP) 漂移。在这项研究中,我们研究了将 GFET 浸没在电解质溶液中对 CNP 值的影响。结果表明,随着浸泡时间的延长,CNP 从大约 180 mV 显著下降到几乎为零。电学测量期间的 CNP 漂移也因长时间浸没而受到抑制。这些见解可用于开发改进型 SG-GFET 。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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