Ensuring cross-device portability of electromagnetic side-channel analysis for digital forensics

IF 2 4区 医学 Q3 COMPUTER SCIENCE, INFORMATION SYSTEMS
Lojenaa Navanesan , Nhien-An Le-Khac , Mark Scanlon , Kasun De Zoysa , Asanka P. Sayakkara
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Abstract

Investigation on smart devices has become an essential subdomain in digital forensics. The inherent diversity and complexity of smart devices pose a challenge to the extraction of evidence without physically tampering with it, which is often a strict requirement in law enforcement and legal proceedings. Recently, this has led to the application of non-intrusive Electromagnetic Side-Channel Analysis (EM-SCA) as an emerging approach to extract forensic insights from smart devices. EM-SCA for digital forensics is still in its infancy, and has only been tested on a small number of devices so far. Most importantly, the question still remains whether Machine Learning (ML) models in EM-SCA are portable across multiple devices to be useful in digital forensics, i.e., cross-device portability. This study experimentally explores this aspect of EM-SCA using a wide set of smart devices. The experiments using various iPhones and Nordic Semiconductor nRF52-DK devices indicate that the direct application of pre-trained ML models across multiple identical devices does not yield optimal outcomes (under 20 % accuracy in most cases). Subsequent experiments included collecting distinct samples of EM traces from all the devices to train new ML models with mixed device data; this also fell short of expectations (still below 20 % accuracy). This prompted the adoption of transfer learning techniques, which showed promise for cross-model implementations. In particular, for the iPhone 13 and nRF52-DK devices, applying transfer learning techniques resulted in achieving the highest accuracy, with accuracy scores of 98 % and 96 %, respectively. This result makes a significant advancement in the application of EM-SCA to digital forensics by enabling the use of pre-trained models across identical or similar devices.

确保用于数字取证的电磁侧信道分析的跨设备可移植性
对智能设备的调查已成为数字取证的一个重要子领域。智能设备固有的多样性和复杂性给在不对其进行物理篡改的情况下提取证据带来了挑战,而这往往是执法和法律程序的严格要求。最近,非侵入式电磁侧信道分析(EM-SCA)作为一种新兴方法被应用于从智能设备中提取取证信息。用于数字取证的 EM-SCA 仍处于起步阶段,迄今只在少数设备上进行过测试。最重要的问题是,EM-SCA 中的机器学习(ML)模型是否可跨多种设备移植,从而在数字取证中发挥作用,即跨设备移植性。本研究使用多种智能设备对 EM-SCA 的这一方面进行了实验性探索。使用各种 iPhone 和 Nordic Semiconductor nRF52-DK 设备进行的实验表明,在多个相同设备上直接应用预先训练好的 ML 模型无法获得最佳结果(大多数情况下准确率低于 20%)。随后的实验包括从所有器件中收集不同的电磁轨迹样本,利用混合器件数据训练新的 ML 模型;结果也未达到预期(准确率仍低于 20%)。这促使我们采用了转移学习技术,该技术在跨模型实施方面显示出了前景。特别是对于 iPhone 13 和 nRF52-DK 设备,应用迁移学习技术获得了最高的准确率,准确率分别为 98% 和 96%。通过在相同或相似的设备上使用预先训练好的模型,这一结果大大推动了 EM-SCA 在数字取证领域的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
5.90
自引率
15.00%
发文量
87
审稿时长
76 days
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