$$\bar{\varvec{S}}$$ Matrix from a Two-Dimensional Slab Covered by Water Drops in W and J Bands: Comparison of a Full-Wave Method with Measurements

IF 1.8 3区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Infrared, Millimeter, and Terahertz Waves Pub Date : 2024-03-12 DOI:10.1007/s10762-024-00977-y

Christophe Bourlier, Paul Bouquin, Alain Peden, Daniel Bourreau, Nicolas Pinel

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Abstract

This paper presents a full-wave method, based on the method of moments (MoM), to calculate the $\bar{\varvec{S}}$ matrix from a two-dimensional complex sample in millimeter and submillimeter W and J bands. From the surface currents obtained by inverting the impedance matrix and from the Huygens principle, the reflection and transmission coefficients are computed. This allows us to obtain the four elements of the $\bar{\varvec{S}}$ matrix. Firstly, the method is validated from canonical samples (a dielectric slab and a stack of two dielectric slabs) by applying the well-known Fresnel coefficients. Secondly, for the W (75 to 110 GHz) and J (220 to 330 GHz) bands, a PVC slab covered by water drops is considered, for which the $\bar{\varvec{S}}$ matrix is compared with measurements made in quasi-optical free space. A satisfactory agreement is obtained between the measurements and the model.

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水滴覆盖的二维板在 W 波段和 J 波段的 $$bar\{varvec{S}}$ 矩阵：全波方法与测量结果的比较

本文提出了一种基于矩量法（MoM）的全波方法，用于计算毫米波段和亚毫米波段 W 和 J 波段二维复杂样品的 $\bar\varvec{S}}$矩阵。根据阻抗矩阵反演得到的表面电流和惠更斯原理，可以计算出反射系数和透射系数。这样我们就可以得到 $\bar{varvec{S}}) 矩阵的四个元素。首先，通过应用众所周知的菲涅尔系数，从典型样品（一块介质板和两块介质板的叠层）验证了该方法。其次，对于 W（75 至 110 GHz）和 J（220 至 330 GHz）波段，考虑了被水滴覆盖的 PVC 板，并将其 \(bar\{varvec{S}}$ 矩阵与在准光学自由空间中进行的测量进行了比较。测量结果与模型之间取得了令人满意的一致。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Infrared, Millimeter, and Terahertz Waves 工程技术-工程：电子与电气

CiteScore

6.20

自引率

6.90%

发文量

审稿时长

3 months

期刊介绍： The Journal of Infrared, Millimeter, and Terahertz Waves offers a peer-reviewed platform for the rapid dissemination of original, high-quality research in the frequency window from 30 GHz to 30 THz. The topics covered include: sources, detectors, and other devices; systems, spectroscopy, sensing, interaction between electromagnetic waves and matter, applications, metrology, and communications. Purely numerical work, especially with commercial software packages, will be published only in very exceptional cases. The same applies to manuscripts describing only algorithms (e.g. pattern recognition algorithms). Manuscripts submitted to the Journal should discuss a significant advancement to the field of infrared, millimeter, and terahertz waves.