Valentina Corradi , Jack Fosten , Daniel Gutknecht
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引用次数: 0
Abstract
This paper provides novel tests for comparing out-of-sample predictive ability of two or more competing models that are possibly overlapping. The tests do not require pre-testing, they allow for dynamic misspecification and are valid under different estimation schemes and loss functions. In pairwise model comparisons, the test is constructed by adding a random perturbation to both the numerator and denominator of a standard Diebold–Mariano test statistic. This prevents degeneracy in the presence of overlapping models but becomes asymptotically negligible otherwise. The test is shown to control the Type I error probability asymptotically at the nominal level, uniformly over all null data generating processes. A similar idea is used to develop a superior predictive ability test for the comparison of multiple models against a benchmark. Monte Carlo simulations demonstrate that our tests exhibit very good size control in finite samples reducing both over- and under-rejection relative to its competitors. Finally, an application to forecasting U.S. excess bond returns provides evidence in favour of models using macroeconomic factors.
本文提供了新颖的检验方法,用于比较两个或多个可能重叠的竞争模型的样本外预测能力。这些检验不需要预先测试,允许动态错误规范,并在不同的估计方案和损失函数下有效。在成对模型比较中,检验方法是在标准 Diebold-Mariano 检验统计量的分子和分母中加入随机扰动。这可以防止在存在重叠模型时出现退化,但在其他情况下会变得渐近可忽略不计。结果表明,该检验能在名义水平上渐进地控制 I 类错误概率,并在所有空数据生成过程中保持一致。类似的想法还被用于开发一种优越的预测能力检验,用于将多个模型与一个基准进行比较。蒙特卡罗模拟证明,我们的检验在有限样本中表现出非常好的规模控制能力,与竞争对手相比,减少了过高和过低的拒绝率。最后,在预测美国超额债券收益方面的应用为使用宏观经济因素的模型提供了有利证据。
期刊介绍:
The Journal of Econometrics serves as an outlet for important, high quality, new research in both theoretical and applied econometrics. The scope of the Journal includes papers dealing with identification, estimation, testing, decision, and prediction issues encountered in economic research. Classical Bayesian statistics, and machine learning methods, are decidedly within the range of the Journal''s interests. The Annals of Econometrics is a supplement to the Journal of Econometrics.