Tianhui Wang, Jaeseung Baek, Myong K. Jeong, Seongho Seo, Jaekyung Choi
{"title":"Multi-source AdaBoost with cross-weight method for virtual metrology in semiconductor manufacturing","authors":"Tianhui Wang, Jaeseung Baek, Myong K. Jeong, Seongho Seo, Jaekyung Choi","doi":"10.1080/00207543.2024.2318490","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":506250,"journal":{"name":"International Journal of Production Research","volume":" 478","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Production Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/00207543.2024.2318490","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}