Structural, Electrical, and Thermo-electric Characterization of Lightly Zn- doped PbS Films for NH3-gas Sensing

E. Shokr, Wael Mohamed, A. Adam, Moumen Kamel, H. Ali
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Abstract

: The lightly Zn-doped (PbS) 1-x (Zn) x with x=0, 0.03, and 0.05 wt.% in thin film form were produced by thermal vacuum evaporation. The structural, morphological, and elemental composition of the thin films has been analyzed using XRD, SEM, and EDXS, respectively. The electrical conductivity and Seebeck coefficient of (PbS) 1-x (Zn) x film of 200 nm thick were determined and discussed. Thin films' electrical conductivity increased with temperature and film thickness. Pure PbS films manifested a positive Seebeck coefficient value indicating a P-type semiconducting behavior. The appearance of negative S values in Zn: PbS films could be assigned to the increase in electron concentration provided by Zn-doping and refers to the change of the conduction to n-type one. Pure films possess a high majority carrier concentration of 8.07×10 18 Cm -3 . Zinc-metal-doped lead sulfide thin films were tested as NH 3 gas sensors with 150 ppm of target gas concentration. The sensitivity of the PbS sensor to NH 3 gas was determined at various gas concentrations ranging from 50 to 150 ppm. The gas sensitivity increased as concentrations increased. The best-attained results of 93% and 174s & 310s for sensitivity and response & recovery times respectively, were obtained by (PbS) 0.95 (Zn) 0.05 at RT.
用于 NH3 气体传感的轻度掺锌 PbS 薄膜的结构、电气和热电特性分析
:通过热真空蒸发法制备了轻度掺锌的 (PbS) 1-x (Zn) x 薄膜,x=0、0.03 和 0.05 wt.%。分别使用 XRD、SEM 和 EDXS 分析了薄膜的结构、形态和元素组成。测定并讨论了厚度为 200 nm 的 (PbS) 1-x (Zn) x 薄膜的电导率和塞贝克系数。薄膜的电导率随温度和薄膜厚度的增加而增加。纯 PbS 薄膜的塞贝克系数为正值,表明其具有 P 型半导体特性。Zn:PbS 薄膜中出现负 S 值,可能是由于 Zn 掺杂增加了电子浓度,从而使传导变为 n 型。纯薄膜的多数载流子浓度高达 8.07×10 18 Cm -3。掺锌金属硫化铅薄膜作为 NH 3 气体传感器进行了测试,目标气体浓度为 150 ppm。在 50 至 150 ppm 的不同气体浓度下,测定了 PbS 传感器对 NH 3 气体的灵敏度。气体灵敏度随着浓度的增加而增加。在 RT 条件下,(PbS) 0.95 (Zn) 0.05 的灵敏度、响应时间和恢复时间分别达到了 93%、174s 和 310s。
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