Prediction of Residual Defects after Code Review Based on Reviewer Confidence

IF 0.7 4区计算机科学

IEICE Transactions on Information and Systems Pub Date : 2024-03-01 DOI:10.1587/transinf.2023mpl0002

Shin Komeda, Masateru Tsunoda, K. Nakasai, H. Uwano

引用次数: 0

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根据审查员的信心预测代码审查后的残余缺陷

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEICE Transactions on Information and Systems COMPUTER SCIENCE, INFORMATION SYSTEMS-COMPUTER SCIENCE, SOFTWARE ENGINEERING

自引率

0.00%

发文量

238

审稿时长

4.8 months

期刊介绍： Published by The Institute of Electronics, Information and Communication Engineers Subject Area: Mathematics Physics Biology, Life Sciences and Basic Medicine General Medicine, Social Medicine, and Nursing Sciences Clinical Medicine Engineering in General Nanosciences and Materials Sciences Mechanical Engineering Electrical and Electronic Engineering Information Sciences Economics, Business & Management Psychology, Education.