V. V. Abilov, V. A. Streltsov, V. V. Savtsov, S. A. Smotrakov
{"title":"Method for Evaluation of the Shape and Dimensions of a Photosensitive Element of an IR FPA","authors":"V. V. Abilov, V. A. Streltsov, V. V. Savtsov, S. A. Smotrakov","doi":"10.1134/s1064226923140024","DOIUrl":null,"url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Features of the measurement of the NEP of scanning IR FPAs for projecting of the image of a small object into the plane of the array of photosensitive elements are considered. It is shown that the existing method for the measurement of the NEP of IR FPAs yields an incorrect result when the shape and dimensions of the photosensitive element (PSE) are not taken into account. A new technique for evaluation of the shape and dimensions of the PSE based on the application of the Richardson–Lucy iterative deconvolution method is described. Results of application of the proposed technique on real photodetector modules (PMs) are presented. Significant differences in the sizes of PSEs of different PM subarrays are revealed. The use of the image of a horizontal slit to correct the nonuniformity of the voltage sensitivity is proposed.</p>","PeriodicalId":50229,"journal":{"name":"Journal of Communications Technology and Electronics","volume":null,"pages":null},"PeriodicalIF":0.4000,"publicationDate":"2024-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Communications Technology and Electronics","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1134/s1064226923140024","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Features of the measurement of the NEP of scanning IR FPAs for projecting of the image of a small object into the plane of the array of photosensitive elements are considered. It is shown that the existing method for the measurement of the NEP of IR FPAs yields an incorrect result when the shape and dimensions of the photosensitive element (PSE) are not taken into account. A new technique for evaluation of the shape and dimensions of the PSE based on the application of the Richardson–Lucy iterative deconvolution method is described. Results of application of the proposed technique on real photodetector modules (PMs) are presented. Significant differences in the sizes of PSEs of different PM subarrays are revealed. The use of the image of a horizontal slit to correct the nonuniformity of the voltage sensitivity is proposed.
期刊介绍：
Journal of Communications Technology and Electronics is a journal that publishes articles on a broad spectrum of theoretical, fundamental, and applied issues of radio engineering, communication, and electron physics. It publishes original articles from the leading scientific and research centers. The journal covers all essential branches of electromagnetics, wave propagation theory, signal processing, transmission lines, telecommunications, physics of semiconductors, and physical processes in electron devices, as well as applications in biology, medicine, microelectronics, nanoelectronics, electron and ion emission, etc.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
