{"title":"That’s BAD: blind anomaly detection by implicit local feature clustering","authors":"Jie Zhang, Masanori Suganuma, Takayuki Okatani","doi":"10.1007/s00138-024-01511-9","DOIUrl":null,"url":null,"abstract":"<p>Recent studies on visual anomaly detection (AD) of industrial objects/textures have achieved quite good performance. They consider an unsupervised setting, specifically the one-class setting, in which we assume the availability of a set of normal (i.e., anomaly-free) images for training. In this paper, we consider a more challenging scenario of unsupervised AD, in which we detect anomalies in a given set of images that might contain both normal and anomalous samples. The setting does not assume the availability of known normal data and thus is completely free from human annotation, which differs from the standard AD considered in recent studies. For clarity, we call the setting blind anomaly detection (BAD). We show that BAD can be converted into a local outlier detection problem and propose a novel method named PatchCluster that can accurately detect image- and pixel-level anomalies. Experimental results show that PatchCluster shows a promising performance without the knowledge of normal data, even comparable to the SOTA methods applied in the one-class setting needing it.</p>","PeriodicalId":51116,"journal":{"name":"Machine Vision and Applications","volume":"16 1","pages":""},"PeriodicalIF":2.4000,"publicationDate":"2024-03-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Machine Vision and Applications","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1007/s00138-024-01511-9","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE","Score":null,"Total":0}
引用次数: 0
Abstract
Recent studies on visual anomaly detection (AD) of industrial objects/textures have achieved quite good performance. They consider an unsupervised setting, specifically the one-class setting, in which we assume the availability of a set of normal (i.e., anomaly-free) images for training. In this paper, we consider a more challenging scenario of unsupervised AD, in which we detect anomalies in a given set of images that might contain both normal and anomalous samples. The setting does not assume the availability of known normal data and thus is completely free from human annotation, which differs from the standard AD considered in recent studies. For clarity, we call the setting blind anomaly detection (BAD). We show that BAD can be converted into a local outlier detection problem and propose a novel method named PatchCluster that can accurately detect image- and pixel-level anomalies. Experimental results show that PatchCluster shows a promising performance without the knowledge of normal data, even comparable to the SOTA methods applied in the one-class setting needing it.
最近关于工业物体/纹理视觉异常检测(AD)的研究取得了相当不错的效果。这些研究考虑了无监督环境,特别是单类环境,其中我们假设有一组正常(即无异常)图像用于训练。在本文中,我们考虑的是更具挑战性的无监督 AD 场景,即在一组给定的图像中检测异常情况,这组图像可能既包含正常样本,也包含异常样本。这种情况不假定存在已知的正常数据,因此完全不需要人工标注,这与近期研究中考虑的标准 AD 有所不同。为清楚起见,我们称这种设置为盲法异常检测(BAD)。我们的研究表明,BAD 可以转化为局部异常点检测问题,并提出了一种名为 PatchCluster 的新方法,该方法可以准确检测图像和像素级异常点。实验结果表明,PatchCluster 在不了解正常数据的情况下表现出了良好的性能,甚至可以与在单类设置中应用的 SOTA 方法相媲美。
期刊介绍:
Machine Vision and Applications publishes high-quality technical contributions in machine vision research and development. Specifically, the editors encourage submittals in all applications and engineering aspects of image-related computing. In particular, original contributions dealing with scientific, commercial, industrial, military, and biomedical applications of machine vision, are all within the scope of the journal.
Particular emphasis is placed on engineering and technology aspects of image processing and computer vision.
The following aspects of machine vision applications are of interest: algorithms, architectures, VLSI implementations, AI techniques and expert systems for machine vision, front-end sensing, multidimensional and multisensor machine vision, real-time techniques, image databases, virtual reality and visualization. Papers must include a significant experimental validation component.