P. Mangayarkarasi, Arunkumar K, Anitha Juliette Albert
{"title":"Design and Comparison of SEU Tolerant 10T Memory Cell for Radiation Environment Applications","authors":"P. Mangayarkarasi, Arunkumar K, Anitha Juliette Albert","doi":"10.4108/ew.5006","DOIUrl":null,"url":null,"abstract":"Single event upsets (SEUs), which are caused by radiation particles, have emerged as a significant concern in aircraft applications. Soft mistakes, which manifest as corruption of data in memory chips and circuit faults, are mostly produced by SEUs. The utilization of SEUs can have both advantageous and detrimental effects in some critical memory applications. Nevertheless, in adherence to design principles, Radiation-Hardening-By-Design (RHBD) methodologies have been employed to mitigate the impact of soft mistakes in memory. This study presents a novel memory cell design, referred to as a Robust 10T memory cell, which aims to improve dependability in the context of aerospace radiation environments. The proposed design has several advantages, including reduced area, low power consumption, good stability, and a decreased number of transistors. Simulations were conducted using the TSMC 65nm CMO technology, employing the Tanner tool. The parameters of the RHB 10T cell were measured and afterwards compared to those of the 12T memory cell. The findings obtained from the simulation demonstrate that the performance of the 10T memory cell surpasses that of the 12T memory cell.","PeriodicalId":53458,"journal":{"name":"EAI Endorsed Transactions on Energy Web","volume":"38 11","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"EAI Endorsed Transactions on Energy Web","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4108/ew.5006","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
Single event upsets (SEUs), which are caused by radiation particles, have emerged as a significant concern in aircraft applications. Soft mistakes, which manifest as corruption of data in memory chips and circuit faults, are mostly produced by SEUs. The utilization of SEUs can have both advantageous and detrimental effects in some critical memory applications. Nevertheless, in adherence to design principles, Radiation-Hardening-By-Design (RHBD) methodologies have been employed to mitigate the impact of soft mistakes in memory. This study presents a novel memory cell design, referred to as a Robust 10T memory cell, which aims to improve dependability in the context of aerospace radiation environments. The proposed design has several advantages, including reduced area, low power consumption, good stability, and a decreased number of transistors. Simulations were conducted using the TSMC 65nm CMO technology, employing the Tanner tool. The parameters of the RHB 10T cell were measured and afterwards compared to those of the 12T memory cell. The findings obtained from the simulation demonstrate that the performance of the 10T memory cell surpasses that of the 12T memory cell.
期刊介绍:
With ICT pervading everyday objects and infrastructures, the ‘Future Internet’ is envisioned to undergo a radical transformation from how we know it today (a mere communication highway) into a vast hybrid network seamlessly integrating knowledge, people and machines into techno-social ecosystems whose behaviour transcends the boundaries of today’s engineering science. As the internet of things continues to grow, billions and trillions of data bytes need to be moved, stored and shared. The energy thus consumed and the climate impact of data centers are increasing dramatically, thereby becoming significant contributors to global warming and climate change. As reported recently, the combined electricity consumption of the world’s data centers has already exceeded that of some of the world''s top ten economies. In the ensuing process of integrating traditional and renewable energy, monitoring and managing various energy sources, and processing and transferring technological information through various channels, IT will undoubtedly play an ever-increasing and central role. Several technologies are currently racing to production to meet this challenge, from ‘smart dust’ to hybrid networks capable of controlling the emergence of dependable and reliable green and energy-efficient ecosystems – which we generically term the ‘energy web’ – calling for major paradigm shifts highly disruptive of the ways the energy sector functions today. The EAI Transactions on Energy Web are positioned at the forefront of these efforts and provide a forum for the most forward-looking, state-of-the-art research bringing together the cross section of IT and Energy communities. The journal will publish original works reporting on prominent advances that challenge traditional thinking.