Repair of the plasmid pBR322 damaged by γ-irradiation or by restriction endonucleases using different recombination-proficient E. coli strains

M. Bien, H. Steffen, D. Schulte-Frohlinde
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引用次数: 15

Abstract

The plasmid pBR322 was treated with BamHI, PvuII and γ-irradiation to generate double-strand breaks (dsb) containing differently structure ends. Transformation efficiencies, mutation frequencies and clone analyses of enzymatically damaged DNA are compared with the corresponding results from radiolytically damaged DNA. In E. coli K-12 SFX, the yield of transformants produced by the action of BamHI, PvuII and γ-irradiation (30 Gy) is 4.3%, 0.14%, and 0.10%, respectively. The survival of open circular DNA (ocDNA) produced by 30 Gy is 1.3%. The transformation efficiencies show only a slight dependence on SOS induction and on the RecA protein. Mutation frequencies to tetracycline sensitivity (tetS) per surviving plasmid are 2.6% (BamHI), (PvuII) and 0.2% (γ-irradiated DNA with 30 Gy containing ∼ 50% oc DNA and 50% linearized (lin) DNA). The mutation frequency is low at all radiation doses studied (1–50 Gy). Only 15% of the DNA of the tetS mutants from γ-irradiated plasmids contained deletions whereas with enzymatically damaged DNA, 30–50% (BamHI) or 90% (PvuII) contained deletions. In all cases, all deletions comprised 500–1700 base pairs (bp). After SOS induction of the host cells, the mutation frequency of γ-irradiated plasmids increased by a factor of 4, whereas that of the enzymatically damaged plasmids did not change.

For the repair of the enzymatically linearized DNA 2 recombinational pathways are discussed which lead to deletant (pathway I) and non-deletant transformants (pathway II). In addition, BamHI-linearized plasmids may be repaired by enzyme-induced or spontaneous circular alignment followed by ligation. The high percentage of deletions of the tetS mutations for PvuII-linearized DNA with the blunt ends is explained by the illegitimate or site-specific recombination pathway I (see text). The lower percentage of deletions of the tetS mutations with BamHI-linearized DNA with short cohesive ends (4 bp) is proposed to be due to a greater contribution of pathway II and/or by circular alignment followed by ligation. The very small yield and the low percentage of deletant mutations of tetS mutants from radiolytically damaged DNA is proposed to be due to the large overlapping ends (16–100 bp) of the linDNA which easily leads to circular alignment followed by excision repair. The repair of radiolytically produced ocDNA is predominantly due to excision repair. In agrement with this interpretation is the observation that SOS induction of the host increases the mutation incidence of radiolytically damaged DNA but not of enzymatically damaged DNA.

利用不同重组大肠杆菌菌株修复γ辐照或限制性内切酶损伤的质粒pBR322
质粒pBR322经BamHI、PvuII和γ-辐照处理后产生两端结构不同的双链断裂(dsb)。将酶损伤DNA的转化效率、突变频率和克隆分析结果与辐射损伤DNA的相应结果进行了比较。在大肠杆菌K-12 SFX中,BamHI、PvuII和γ辐照(30 Gy)作用下产生的转化子的产率分别为4.3%、0.14%和0.10%。30 Gy辐照产生的开环DNA (ocDNA)存活率为1.3%。转化效率仅对SOS诱导和RecA蛋白有轻微的依赖性。每个存活质粒对四环素敏感性(tetS)的突变频率为2.6% (BamHI), (PvuII)和0.2% (γ辐照DNA, 30 Gy含50% oc DNA和50%线性化(lin) DNA)。在所研究的所有辐射剂量(1-50 Gy)下,突变频率都很低。γ辐照质粒的tetS突变体中只有15%的DNA含有缺失,而酶损伤的DNA中有30-50% (BamHI)或90% (PvuII)含有缺失。在所有病例中,所有缺失都包含500-1700个碱基对(bp)。经SOS诱导后,γ辐照质粒的突变频率增加了4倍,而酶损伤质粒的突变频率没有变化。为了修复酶线性化的DNA 2重组途径,我们讨论了导致缺失(途径I)和非缺失转化(途径II)的重组途径。此外,bamhi线性化的质粒可以通过酶诱导或自发的圆形排列进行修复,然后进行连接。具有钝端的pvuii线性化DNA的tetS突变缺失的高比例可以用非法或位点特异性重组途径I来解释。具有短内聚末端(4bp)的bamhi线性化DNA的tetS突变缺失率较低,这可能是由于途径II的贡献更大和/或通过环比对然后连接。从放射性损伤DNA中产生的极低产量和低缺失突变百分比被认为是由于linDNA的大重叠末端(16-100 bp)容易导致圆形比对然后切除修复。放射溶解产生的ocDNA的修复主要是由于切除修复。与这一解释一致的观察结果是,宿主的SOS诱导增加了辐射损伤DNA的突变发生率,而不是酶损伤DNA的突变发生率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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