On a 1D-electrostatic test problem for the PIC method

Pub Date : 2024-02-10 DOI:10.1515/rnam-2024-0002
Eugene V. Chizhonkov
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Abstract

A test problem for the ‘particle-in-cell’ method is proposed which allows one to check individual errors on each stage of numerical implementation of the method. General testing usually controls only total (final) error. Using the test problem, we analyze errors of a difference method of MacCormack type and the CIC method being the most popular version of the ‘particle-in-cell’ method. It is shown that the CIC method having also the second formal order of accuracy is seriously inferior to the difference method under the same given error and same grid parameters. In particular, the results of the particle method lose their sense after approximately one calculation period, although the time interval of confidence in simulation data for the difference method is practically unlimited. The testing method proposed here is suitable for an arbitrary one-dimensional version of the ‘particle-in-cell’ method, and it allows one not only to compare numerical implementations of individual stages with each other, but also to verify available theoretical results.
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关于 PIC 方法的一维静电测试问题
提出了一个 "粒子入胞 "方法的测试问题,可以检查该方法数值实施过程中每个阶段的个别误差。一般测试通常只控制总(最终)误差。利用该测试问题,我们分析了 MacCormack 类型差分法和 CIC 方法(最流行的 "粒子入胞 "方法版本)的误差。结果表明,在给定误差和网格参数相同的情况下,精度也达到第二形式阶的 CIC 方法严重逊色于差分法。特别是,粒子法的结果在大约一个计算周期后就失去了意义,而差分法的模拟数据置信时间间隔实际上是无限的。本文提出的测试方法适用于 "微粒入胞 "方法的任意一维版本,不仅可以比较各个阶段的数值实现,还可以验证现有的理论结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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