{"title":"Edge Device Fault Probability Based Intelligent Calculations for Fault Probability of Smart Systems","authors":"Shasha Li;Tiejun Cui;Wattana Viriyasitavat","doi":"10.26599/TST.2023.9010085","DOIUrl":null,"url":null,"abstract":"In a smart system, the faults of edge devices directly impact the system's overall fault. Further, complexity arises when different edge devices provide varying fault data. To study the Smart System Fault Evolution Process (SSFEP) under different fault data conditions, an intelligent method for determining the Smart System Fault Probability (SSFP) is proposed. The data types provided by edge devices include the following: (1) only known edge device fault probability; (2) known Edge Device Fault Probability Distribution (EDFPD); (3) known edge device fault number and EDFPD; (4) known factor state of the edge device fault and EDFPD. Moreover, decision methods are proposed for each data case. Transfer Probability (TP) is divided into Continuity Transfer Probability (CTP) and Filterability Transfer Probability (FTP). CTP asserts that a Cause Event (CE) must lead to a Result Event (RE), while FTP requires CF probability to exceed a threshold before RF occurs. These probabilities are used to calculate SSFP. This paper introduces a decision method using the information diffusion principle for low-data SSFP determination, along with an improved method. The method is based on space fault network theory, abstracting SSFEP into a System Fault Evolution Process (SFEP) for research purposes.","PeriodicalId":48690,"journal":{"name":"Tsinghua Science and Technology","volume":"29 4","pages":"1023-1036"},"PeriodicalIF":6.6000,"publicationDate":"2024-02-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10431729","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Tsinghua Science and Technology","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10431729/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"Multidisciplinary","Score":null,"Total":0}
引用次数: 0
Abstract
In a smart system, the faults of edge devices directly impact the system's overall fault. Further, complexity arises when different edge devices provide varying fault data. To study the Smart System Fault Evolution Process (SSFEP) under different fault data conditions, an intelligent method for determining the Smart System Fault Probability (SSFP) is proposed. The data types provided by edge devices include the following: (1) only known edge device fault probability; (2) known Edge Device Fault Probability Distribution (EDFPD); (3) known edge device fault number and EDFPD; (4) known factor state of the edge device fault and EDFPD. Moreover, decision methods are proposed for each data case. Transfer Probability (TP) is divided into Continuity Transfer Probability (CTP) and Filterability Transfer Probability (FTP). CTP asserts that a Cause Event (CE) must lead to a Result Event (RE), while FTP requires CF probability to exceed a threshold before RF occurs. These probabilities are used to calculate SSFP. This paper introduces a decision method using the information diffusion principle for low-data SSFP determination, along with an improved method. The method is based on space fault network theory, abstracting SSFEP into a System Fault Evolution Process (SFEP) for research purposes.
期刊介绍:
Tsinghua Science and Technology (Tsinghua Sci Technol) started publication in 1996. It is an international academic journal sponsored by Tsinghua University and is published bimonthly. This journal aims at presenting the up-to-date scientific achievements in computer science, electronic engineering, and other IT fields. Contributions all over the world are welcome.