Han-Bo Zhang, Peng Wang, Ming-Ming Zhang, Wei Wang
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引用次数: 0
Abstract
In the last decade, there has been significant progress in time series classification. However, in real-world industrial settings, it is expensive and difficult to obtain high-quality labeled data. Therefore, the positive and unlabeled learning (PU-learning) problem has become more and more popular recently. The current PU-learning approaches of the time series data suffer from low accuracy due to the lack of negative labeled time series. In this paper, we propose a novel shapelet based two-step (2STEP) PU-learning approach. In the first step, we generate shapelet features based on the positive time series, which are used to select a set of negative examples. In the second step, based on both positive and negative time series, we select the final features and build the classification model. The experimental results show that our 2STEP approach can improve the average F1 score on 15 datasets by 9.1% compared with the baselines, and achieves the highest F1 score on 10 out of 15 time series datasets.
期刊介绍:
Journal of Computer Science and Technology (JCST), the first English language journal in the computer field published in China, is an international forum for scientists and engineers involved in all aspects of computer science and technology to publish high quality and refereed papers. Papers reporting original research and innovative applications from all parts of the world are welcome. Papers for publication in the journal are selected through rigorous peer review, to ensure originality, timeliness, relevance, and readability. While the journal emphasizes the publication of previously unpublished materials, selected conference papers with exceptional merit that require wider exposure are, at the discretion of the editors, also published, provided they meet the journal''s peer review standards. The journal also seeks clearly written survey and review articles from experts in the field, to promote insightful understanding of the state-of-the-art and technology trends.
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