Measurement of optical coatings absorption at 1570 nm and simulations of photo-induced modifications of spectral function under high power laser exposure

Laser Damage Pub Date : 2023-11-24 DOI:10.1117/12.2685174
Mathias Soulier, Laurent Gallais, Julien Lumeau, H. Krol, Emilie Steck, Mathieu Boutillier
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Abstract

Free space communications between ground stations and geostationary satellites offer high-speed and secure data transmission, but compensating for atmospheric absorption poses a significant challenge. The need for high levels of beam power to overcome atmospheric losses calls for optics that can withstand strong flux, especially in the continuous wave (CW) regime. In this context, the absorption of optics at 1.5 µm is a critical parameter that must be accurately measured and understood to develop efficient and reliable photonic systems. This study focuses on the absorption of optical coatings at 1570 nm. Lock-In Thermography (LIT) has been developed to measure the total absorption of the coatings with high sensitivity under 1 ppm. A modulated 100 W CW laser is used to induce heating into the coating stack, and the resulting rise in internal temperature is measured with a thermal camera. The LIT experimental setup offers a non-destructive and non-contact measurement technique, making it ideal for assessing the absorption of delicate thin-film coatings. To understand the photo induced effects in a stack of thin film layers subjected to high-power laser heating, a finite element model is developed using COMSOL. The model simulates the index and thickness variations of each layer and predicts the shift in optical function resulting from photo induced effects. The results offer valuable insights into the impact of laser-induced heating on the optical properties of the coatings and provide guidelines for designing robust and reliable photonic systems.
1570 纳米波长光学镀膜吸收测量以及高功率激光照射下光谱功能光诱导修正模拟
地面站与地球静止卫星之间的自由空间通信可提供高速、安全的数据传输,但补偿大气吸收是一项重大挑战。需要高水平的光束功率来克服大气损耗,这就要求光学器件能够承受强流量,尤其是在连续波(CW)模式下。在这种情况下,1.5 µm 处光学器件的吸收是一个关键参数,必须对其进行精确测量和了解,才能开发出高效可靠的光子系统。本研究的重点是 1570 纳米波长光学涂层的吸收。我们开发了锁定热成像技术(LIT)来测量涂层的总吸收率,其灵敏度低于 1 ppm。使用调制的 100 W CW 激光对涂层堆栈进行加热,并使用热像仪测量由此产生的内部温度升高。LIT 实验装置提供了一种非破坏性和非接触式测量技术,因此非常适合评估精密薄膜涂层的吸收情况。为了解在高功率激光加热下薄膜层堆栈的光诱导效应,使用 COMSOL 开发了一个有限元模型。该模型模拟了每一层的折射率和厚度变化,并预测了光诱发效应导致的光学函数变化。研究结果为了解激光诱导加热对涂层光学特性的影响提供了宝贵的见解,并为设计坚固可靠的光子系统提供了指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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