Simulation of the Compression Testing of Additively Manufactured Lattice Structures Using Inputs from Microcomputed Tomography

Minsol Park, M. Venter, A. du Plessis
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Abstract

Finite element (FE) modeling is a powerful tool for the virtual testing of components, especially for high-value manufacturing like additive manufacturing (AM). AM often involves lattice structures in parts, imparting unique mechanical properties. Numerical models allow for cost-effective virtual testing, but computational limitations hinder comprehensive investigations on lattice structures, and idealized models may not fully represent actual manufactured behavior. This study proposes a simplified numerical model for analyzing lattice structure compression behavior before failure, incorporating X-ray microcomputed tomography (CT) scan data. The model includes real manufacturing defects, such as geometrical inaccuracies, internal porosity, and surface roughness. It closely fits compression test results from samples with varied defects, with a maximum error of 17% for stiffness, 13% for yield stress, and 7% for peak stress. The model offers promise for developing manufacturing defect-incorporated lattice representative volume elements (RVEs) to design AM parts with lattice regions. Replacing complex lattice structures with solid-infilled RVEs in simulations reduces computational costs significantly. This approach allows efficient exploration of lattice AM components’ mechanical behavior, accounting for manufacturing defects and offering insights for design optimization and material selection.
利用微计算机断层扫描输入模拟快速成型晶格结构的压缩测试
有限元(FE)建模是对部件进行虚拟测试的强大工具,尤其适用于增材制造(AM)等高价值制造。增材制造通常涉及零件的晶格结构,从而赋予其独特的机械性能。数值模型可实现经济高效的虚拟测试,但计算能力的限制阻碍了对晶格结构的全面研究,而且理想化的模型可能无法完全代表实际制造行为。本研究结合 X 射线微计算机断层扫描(CT)数据,提出了一种简化的数值模型,用于分析晶格结构失效前的压缩行为。该模型包含真实的制造缺陷,如几何误差、内部孔隙率和表面粗糙度。该模型与存在各种缺陷的样品的压缩测试结果非常吻合,刚度的最大误差为 17%,屈服应力的最大误差为 13%,峰值应力的最大误差为 7%。该模型有望用于开发制造缺陷融入晶格代表体积元素(RVE),以设计具有晶格区域的 AM 零件。在模拟中用固体填充的 RVE 取代复杂的晶格结构,可大大降低计算成本。这种方法可以有效探索晶格 AM 部件的机械行为,考虑制造缺陷,并为设计优化和材料选择提供见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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