Non-conjugate multi-peak hot-images induced by double defects in high power laser systems

Yuxin Liu, Zhaoyang Jiao, Hongchang Wang, Mingying Sun, Jianqiang Zhu
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Abstract

In high-power laser systems, hot image is a phenomenon of drastic intensification on the downstream light field due to nonlinear Kerr self-focusing, which poses a threat to the safety of optical components. It is traditionally believed that a single defect will trigger a hot image, which appears at the downstream conjugate position of the defect relative to the nonlinear medium. Our previous study has shown that a phase defect can cause double-peak hot images when considering the defect edge steepness. When the number of defects increases, the downstream modulation becomes more complex. Here the evolution of the hot-image is analyzed when there are two symmetrical distributed super-Gaussian defects around the beam center for example. The results show that double defects will form five modulation peaks. The second and fourth peaks are the results of two single defects. Another three peaks are in the center of the beam, which do not appear in the case of single defect. The linear modulation peak is generated by the interaction of diffraction fringes from double defects and finally forms the first peak. The second and third strong peaks are caused by the interference between the second and fourth peaks, respectively. The characteristics of these three peaks are affected by the center spacing and size. The existence of these new strong modulation regions will pose a potential damage threat to the optical components at this position, so they need to be avoided when designing the arrangement of the components.
高功率激光系统中双缺陷诱发的非共轭多峰值热图像
在高功率激光系统中,热像是一种由于非线性克尔自聚焦而导致下游光场急剧增强的现象,对光学元件的安全构成威胁。传统观点认为,单个缺陷会引发热像,热像出现在缺陷相对于非线性介质的下游共轭位置。我们之前的研究表明,当考虑到缺陷边缘的陡度时,一个相位缺陷会引起双峰热像。当缺陷数量增加时,下游调制会变得更加复杂。这里以光束中心周围存在两个对称分布的超高斯缺陷为例,分析了热像的演变。结果显示,双缺陷会形成五个调制峰。第二个和第四个峰是两个单缺陷的结果。另外三个峰位于光束中心,在单缺陷情况下不会出现。线性调制峰是由双缺陷的衍射条纹相互作用产生的,最终形成第一个峰值。第二和第三个强峰分别由第二和第四个峰之间的干涉引起。这三个峰的特征受中心间距和尺寸的影响。这些新的强调制区域的存在将对该位置的光学元件构成潜在的损坏威胁,因此在设计元件排列时需要避免。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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