Progress on defect inspection for large-aperture optics

Jian Chen, Jianda Shao, Ming Huang, Shijie Liu, Zhouling Wu
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Abstract

Progress report is made on the development of a multimodal inspection technique for surface/sub-surface defect characterizations of large-aperture optics. A high-speed laser scattering imaging with a sensitivity at 200-nm scale is used for defect discovery of large-aperture optics. The defect discovery provides statistical results of defects of the optics. After that, a multifunctional microscopic method is used for local defect review. A photothermal scanning microscopy is used for specific characterization of absorption defects, and a confocal microscopy is used for characterization of sub-surface defects. The defect review provides information for defect classification. Based on this multimodal technique, an inspection system is also developed and used for defect characterizations of large optics. Data analysis of the output of the system offers insight into the quality control process. In addition, a absorption distribution curve method is also proposed, which provides a new vision for evaluating the quality of large-aperture optics.
大孔径光学元件缺陷检测进展情况
本报告介绍了用于表征大孔径光学器件表面/次表面缺陷的多模态检测技术的开发进展。使用灵敏度为 200 纳米的高速激光散射成像来发现大孔径光学器件的缺陷。缺陷发现可提供光学元件缺陷的统计结果。然后,使用多功能显微镜方法进行局部缺陷审查。光热扫描显微镜用于具体鉴定吸收缺陷,共聚焦显微镜用于鉴定次表面缺陷。缺陷审查为缺陷分类提供了信息。基于这种多模态技术,还开发了一种检测系统,用于大型光学器件的缺陷表征。通过对系统输出的数据分析,可以深入了解质量控制过程。此外,还提出了一种吸收分布曲线方法,为评估大孔径光学器件的质量提供了新的视角。
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